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DIN EN 60749-11:2003-04

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD

Available format(s)

Hardcopy , PDF

Language(s)

German

Published date

01-01-2003

Foreword
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

Describes the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.

DevelopmentNote
Supersedes DIN EN 60749 (06/2005)
DocumentType
Standard
Pages
10
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Current
Supersedes

Standards Relationship
UNE-EN 60749-11:2003 Identical
I.S. EN 60749-11:2002 Identical
NF EN 60749-11 : 2002 Identical
BS EN 60749-11:2002 Identical
NBN EN 60749-11 : 2003 Identical
EN 60749-11:2002 Identical
IEC 60749-11:2002 Identical

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