DIN IEC 62416:2007-08 (Draft)
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
HOT CARRIER TEST ON MOS TRANSISTORS
12-01-2010
01-12-2013
Dieses Dokument legt das Hot-Carrier-Prüfverfahren für NMOS- und PMOS-Transistoren auf Waferniveau fest. Die Prüfung wurde erarbeitet, um zu ermitteln, inwiefern die einzelnen Transistoren eines bestimmten (C)MOS-Prozesses der geforderten Hot-Carrier-Lebensdauer entsprechen.
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