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DIN IEC/TS 62132-9 : 2015

Current

Current

The latest, up-to-date edition.

INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 9: MEASUREMENT OF RADIATED IMMUNITY - SURFACE SCAN METHOD (IEC/TS 62132-9:2014)

Available format(s)

Hardcopy

Language(s)

German

Published date

08-01-2015

DocumentType
Technical Specification
Pages
0
PublisherName
Verband Deutscher Elektrotechniker
Status
Current

Standards Relationship
IEC TS 62132-9:2014 Identical
VDE V 0847-22-9 : 2015 Corresponds

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US$136.12
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