DIN V VDE V 0126-18-4-2 : 2007
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
SOLAR WAFERS - PART 4-2: PROCESS FOR MEASURING THE ELECTRICAL CHARACTERISTICS OF SILICON - MINORITY CARRIER LIFETIME, LABORATORY MEASURING METHOD
12-01-2009
01-12-2013
Das Verfahren nach dieser Norm dient dazu, die effektive Lebensdauer von optisch erzeugten Überschussladungsträgern als effektive Minoritätsladungsträgerlebensdauer von kristallinen Siliciumscheiben zu bestimmen. Die Methode wird für Messungen in der Fertigungslinie (Inline) empfohlen.
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