EN 153000:1998

Withdrawn

Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)

Withdrawn date

04-25-2018

Published date

04-27-1998

Publisher

European Committee for Standards - Electrical

1 General
2 Quality assessment procedures
3 Test and measurement procedures (general guidance)
Annex A General inspection requirements for rectifier
diodes and thyristors
Annex B Additional electrical test methods
Annex C Screening
Annex D Dimensions
Annex E Direction of applied forces for mechanical tests
Figures

This document applies to discrete pressure contact power semiconductor devices namely rectifier diodes, transistors, thyristors and their derivatives.

Committee	SR 47E
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Withdrawn

Standards	Relationship
I.S. EN 153000:1998	Identical
NEN EN 153000 : 1998	Identical
BS EN 153000:1998	Identical
CEI EN 153000 : 1999	Identical
SN EN 153000 : 1998	Identical
UNE-EN 153000:1998	Identical
PN EN 153000 : 2005	Identical
DIN EN 153000:1999-01	Identical

IEC 60068-1:2013	Environmental testing - Part 1: General and guidance
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
ISO 8601:2004	Data elements and interchange formats Information interchange Representation of dates and times
EN 100114-1 : 1996	RULE OF PROCEDURE - QUALITY ASSESSMENT PROCEDURES - PART 1: CECC REQUIREMENTS FOR THE APPROVAL OF AN ORGANIZATION
IEC 60068-2-17:1994	Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-2:2007	Environmental testing - Part 2-2: Tests - Test B: Dry heat
CECC 00111 : 80 AMD 3	CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
ISO 2015:1976	Numbering of weeks
ISO 497:1973	Guide to the choice of series of preferred numbers and of series containing more rounded values of preferred numbers
IEC 60148:1969	Letter symbols for semiconductor devices and integrated microcircuits
IEC 60747-6:2016	Semiconductor devices - Part 6: Discrete devices - Thyristors
IEC 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature
CECC 00007 : 1978	BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES
IEC 60747-2:2016	Semiconductor devices - Part 2: Discrete devices - Rectifier diodes