EN 60068-2-13:1999
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Environmental testing - Part 2: Tests - Test M: Low air pressure
Superseded date
04-26-2021
Published date
04-15-1999
FOREWORD
PREFACE
Clause
1. Introduction
2. General description
3. Description of test apparatus
4. Severities
5. Pre-conditioning
6. Initial measurements
7. Conditioning
8. Recovery
9. Final measurements
10. Information to be given in the relevant
specification
Annex ZA (normative) Normative references to international
publications with their corresponding
European publications
Determines the ability of components, equipment and other articles to be stored, transported or used under low air pressure conditions.
| Committee |
CLC/SR 104
|
| DevelopmentNote |
Supersedes HD 323.2.13. (03/2004)
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| OVE/ONORM EN 60068-2-13 : 2000 | Identical |
| SN EN 60068-2-13 : 1999 | Identical |
| PN EN 60068-2-13 : 2002 | Identical |
| I.S. EN 60068-2-13:1999 | Identical |
| NEN EN IEC 60068-2-13 : 1999 | Identical |
| BS EN 60068-2-13:1999 | Identical |
| CEI EN 60068-2-13 : 2000 | Identical |
| NF EN 60068 2-13 : 1999 | Identical |
| IEC 60068-2-13:1983 | Identical |
| NBN EN 60068 2-13 : 1999 | Identical |
| UNE-EN 60068-2-13:2000 | Identical |
| DIN EN 60068-2-13:2000-02 | Identical |
| BS EN 60749-14:2003 | Identical |
| BS EN 61337-1:2004 | Filters using waveguide type dielectric resonators Generic specification |
| BS EN 60689:2009 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
| CEI EN 62341-5 : 2011 | ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS - PART 5: ENVIRONMENTAL TESTING METHODS |
| BS EN 62575-1:2016 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification |
| 14/30311384 DC : 0 | BS EN 60115-2:2014+A1 - FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 2: SECTIONAL SPECIFICATION: LEADED FIXED LOW POWER FILM RESISTORS |
| BS EN 61757-1:2012 | Fibre optic sensors Generic specification |
| BS EN 62040-5-3:2017 | Uninterruptible power systems (UPS) DC output UPS. Performance and test requirements |
| BS EN 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality Generic specification |
| CEI EN 60512-11-11 : 2003 | CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 11-11: CLIMATIC TESTS - TEST 11K: LOW AIR PRESSURE |
| BS EN 60384-1:2016 | Fixed capacitors for use in electronic equipment Generic specification |
| BS EN 60938-1:2000 | Fixed inductors for electromagnetic interference suppression Generic specification |
| BS EN 140101:2008 | Blank Detail Specification. Fixed low power film resistors |
| BS EN 61169-8:2007 | Radio-frequency connectors Sectional specification. RF coaxial connectors with inner diameter of outer conductor 6,5 mm (0,256 in) with bayonet lock. Characteristic impedance 50 ohms (type BNC) |
| I.S. EN 61051-1:2008 | VARISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION |
| I.S. EN 61757-1:2012 | FIBRE OPTIC SENSORS - PART 1: GENERIC SPECIFICATION (IEC 61757-1:2012 (EQV)) |
| I.S. EN 61810-7:2006 | ELECTROMECHANICAL ELEMENTARY RELAYS - PART 7: TEST AND MEASUREMENT PROCEDURES |
| I.S. EN 140402-801:2015 | DETAIL SPECIFICATION: FIXED LOW POWER WIREWOUND SURFACE MOUNT (SMD) RESISTORS - RECTANGULAR - STABILITY CLASSES 0,5; 1; 2 |
| I.S. EN 62575-1:2016 | RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| I.S. EN 62341-5:2009 | ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS - PART 5: ENVIRONMENTAL TESTING METHODS |
| I.S. EN 60939-1:2010 | PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION |
| EN 60512-9-3:2011 | CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 9-3: ENDURANCE TESTS - TEST 9C: MECHANICAL OPERATION (ENGAGING/SEPARATING) WITH ELECTRICAL LOAD |
| EN 61337-1:2004 | Filters using waveguide type dielectric resonators - Part 1: Generic specification |
| EN 61019-1 : 2005 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| EN 62246-1:2015 | Reed switches - Part 1: Generic specification |
| EN 140402-801:2015 | Detail specification: Fixed low power wirewound surface mount (SMD) resistors - Rectangular - Stability classes 0,5; 1; 2 |
| EN 60939-1:2010 | PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION |
| EN 140101:2008 | Blank Detail Specification: Fixed low power film resistors |
| EN 62341-5:2009 | Organic Light Emitting Diode (OLED) displays - Part 5: Environmental testing methods |
| EN 62040-5-3:2017 | Uninterruptible power systems (UPS) - Part 5-3: DC output UPS - Performance and test requirements |
| EN 61051-1:2008 | Varistors for use in electronic equipment - Part 1: Generic specification |
| EN 60738-1:2006/A1:2009 | THERMISTORS - DIRECTLY HEATED POSITIVE TEMPERATURE COEFFICIENT - PART 1: GENERIC SPECIFICATION |
| EN 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
| EN 60115-2:2015 | Fixed resistors for use in electronic equipment - Part 2: Sectional specification: Leaded fixed low power film resistors |
| EN 60068-2-40:1999 | Environmental testing - Part 2: Tests - Test Z/AM: Combined cold/low air pressure tests |
| EN 140401:2009 | Blank Detail Specification: Fixed low power film surface mount (SMD) resistors |
| EN 60068-2-41:1999 | Environmental testing - Part 2: Tests - Test Z/BM: Combined dry heat/low air pressure tests |
| EN 140402:2015/A1:2016 | BLANK DETAIL SPECIFICATION: FIXED LOW POWER WIREWOUND SURFACE MOUNT (SMD) RESISTORS |
| BS EN 60738-1 : 2006 | THERMISTORS - DIRECTLY HEATED POSITIVE TEMPERATURE COEFFICIENT - PART 1: GENERIC SPECIFICATION |
| BS EN 62341-5:2009 | Organic light emitting diode (OLED) displays Environmental testing methods |
| BS EN 61051-1:2008 | Varistors for use in electronic equipment Generic specification |
| I.S. EN 61337-2:2004 | FILTERS USING WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 2: GUIDANCE FOR USE |
| BS EN 61338-1:2005 | Waveguide type dielectric resonators Generic specification |
| BS EN 60115-8-1:2015 | Fixed resistors for use in electronic equipment Blank detail specification: Fixed surface mount (SMD) low power film resistors for general electronic equipment, classification level G |
| BS EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement |
| BS EN 61988-4:2007 | Plasma display panels Climatic and mechanical testing methods |
| I.S. EN 61337-1:2005 | FILTERS USING WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1: GENERIC SPECIFICATION |
| CEI EN 60393-1 : 2010 | POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION |
| CEI EN 62884-1 : 1ED 2018 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
| I.S. EN 140402:2015 | BLANK DETAIL SPECIFICATION: FIXED LOW POWER WIREWOUND SURFACE MOUNT (SMD) RESISTORS |
| BS EN 60115-1 : 2011 | FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION |
| I.S. EN 60115-8-1:2015 | FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 8-1: BLANK DETAIL SPECIFICATION: FIXED SURFACE MOUNT (SMD) LOW POWER FILM RESISTORS FOR GENERAL ELECTRONIC EQUIPMENT, CLASSIFICATION LEVEL G |
| EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| I.S. EN 60115-8:2012 | FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 8: SECTIONAL SPECIFICATION - FIXED SURFACE MOUNT RESISTORS (IEC 60115-8:2009 (MOD)) |
| I.S. EN 60384-1:2016 | FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION |
| I.S. EN 140401:2009 | BLANK DETAIL SPECIFICATION: FIXED LOW POWER FILM SURFACE MOUNT (SMD) RESISTORS |
| CEI EN 60512-9-3 : 2012 | CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 9-3: ENDURANCE TESTS - TEST 9C: MECHANICAL OPERATION (ENGAGING/SEPARATING) WITH ELECTRICAL LOAD |
| I.S. EN 60368-1:2000 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| I.S. EN 60393-1:2009 | POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION |
| I.S. EN 140100:2008 | SECTIONAL SPECIFICATION: FIXED LOW POWER FILM RESISTORS |
| I.S. EN 60512-9-3:2011 | CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 9-3: ENDURANCE TESTS - TEST 9C: MECHANICAL OPERATION (ENGAGING/SEPARATING) WITH ELECTRICAL LOAD |
| I.S. EN 60512-11-11:2002 | CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 11-11: CLIMATIC TESTS - TEST 11K: LOW AIR PRESSURE |
| BS EN 60115-2:2015 | Fixed resistors for use in electronic equipment Sectional specification: Leaded fixed low power film resistors |
| CEI EN 60115-8-1 : 2016 | FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 8-1: BLANK DETAIL SPECIFICATION: FIXED SURFACE MOUNT (SMD) LOW POWER FILM RESISTORS FOR GENERAL ELECTRONIC EQUIPMENT, CLASSIFICATION LEVEL G |
| BS EN 60393-1:2009 | Potentiometers for use in electronic equipment Generic specification |
| BS EN 60939-1:2010 | Passive filter units for electromagnetic interference suppression Generic specification |
| BS EN 60068-2-41:2000 | Environmental testing. Test methods Tests. Test Z/BM: Combined dry heat/low air pressure tests |
| BS EN 61019-1:2005 | Surface acoustic wave (SAW) resonators Generic specification |
| BS EN 140401-801 : 2007 | DETAIL SPECIFICATION: FIXED LOW POWER FILM SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 0,1; 0,25; 0,5; 1 |
| BS EN 140401-803 : 2007 | DETAIL SPECIFICATION: FIXED LOW POWER FILM SMD RESISTORS - CYLINDRICAL - STABILITY CLASSES 0,05; 0,1; 0,25; 0,5; 1; 2 |
| BS EN 61169-1:2013 | Radio-frequency connectors Generic specification. General requirements and measuring methods |
| CEI EN 60368-1 : 2006 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| BS EN 60512-11-11:2002 | Connectors for electronic equipment. Tests and measurements. Climatic tests Test 11k. Low air pressure |
| I.S. EN 60115-2:2015 | FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 2: SECTIONAL SPECIFICATION: LEADED FIXED LOW POWER FILM RESISTORS |
| BS EN 60068-2-40:2000 | Environmental testing. Test methods Test Z/AM. Combined cold/low air pressure tests |
| 06/30155922 DC : 0 | BS EN 140100 - SECTIONAL SPECIFICATION - FIXED LOW POWER FILM RESISTORS |
| 06/30155905 DC : DRAFT SEP 2006 | BS EN 140401-803 - DETAIL SPECIFICATION - FIXED LOW POWER FILM SMD RESISTORS - CYLINDRICAL - STABILITY CLASSES 0,05; 0,1; 0,25; 0,5; 1; 2 |
| 14/30317306 DC : 0 | BS EN 60115-8-1:2014+A1 - FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 8-1: BLANK DETAIL SPECIFICATION: FIXED SURFACE MOUNT (SMD) LOW POWER FILM RESISTORS FOR GENERAL ELECTRONIC EQUIPMENT, CLASSIFICATION LEVEL G |
| BS EN 60368-1:2000 | Piezoelectric filters Generic specification |
| BS EN 60512-9-3:2011 | Connectors for electronic equipment. Tests and measurements Endurance tests. Test 9c. Mechanical operation (engaging/separating) with electrical load |
| UNE-EN 61020-1:2011 | Electromechanical switches for use in electrical and electronic equipment - Part 1: Generic specification |
| OVE/ONORM EN 61051-1 : 2009 | VARISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION |
| I.S. EN 62604-1:2015 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| I.S. EN 140401-804:2011 | DETAIL SPECIFICATION: FIXED LOW POWER FILM HIGH STABILITY SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 0,1; 0,25 |
| BS EN 140402 : 2015 | BLANK DETAIL SPECIFICATION: FIXED LOW POWER WIREWOUND SURFACE MOUNT (SMD) RESISTORS |
| I.S. EN 140101-806:2009 | DETAIL SPECIFICATION: FIXED LOW POWER FILM RESISTORS - METAL FILM RESISTORS ON HIGH GRADE CERAMIC, CONFORMAL COATED OR MOLDED, AXIAL OR PREFORMED LEADS |
| I.S. EN 60749-2:2002 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 2: LOW AIR PRESSURE |
| I.S. EN 61338-1:2005 | WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1: GENERIC SPECIFICATION |
| BS EN 140401-804 : 2011 | DETAIL SPECIFICATION: FIXED LOW POWER FILM HIGH STABILITY SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 0,1; 0,25 |
| BS EN 140401:2009 | Blank Detail Specification. Fixed low power film surface mount (SMD) resistors |
| I.S. EN 62884-1:2017 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
| I.S. EN 61019-1:2005 | SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION |
| CEI EN 60068-2-40 : 2000 | ENVIRONMENTAL TESTING - PART 2: TESTS - TEST Z/AM: COMBINED COLD/LOW AIR PRESSURE TESTS |
| I.S. EN 60938-1:1999 | FIXED INDUCTORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION |
| I.S. EN 60068-2-41:1999 | ENVIRONMENTAL TESTING - PART 2: TESTS - TEST Z/BM: COMBINED DRY HEAT/LOW AIR PRESSURE TESTS |
| I.S. EN 60115-1:2011 | FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION (IEC 60115-1:2008, MODIFIED) |
| EN 140401-804:2011/A1:2013 | DETAIL SPECIFICATION: FIXED LOW POWER FILM HIGH STABILITY SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 0,1; 0,25 |
| BS EN 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification |
| BS EN 140100:2008 | Sectional specification. Fixed low power film resistors |
| BS EN 60115-8:2012 | Fixed resistors for use in electronic equipment Sectional specification. Fixed surface mount resistors |
| 10/30237986 DC : 0 | BS EN 140401-804 - DETAIL SPECIFICATION: FIXED LOW POWER FILM HIGH STABILITY SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 0,1; 0,25 |
| 08/30186808 DC : DRAFT JULY 2008 | BS EN 140401 - BLANK DETAIL SPECIFICATION - FIXED LOW POWER NON-WIRE-WOUND SURFACE MOUNT (SMD) RESISTORS |
| BS EN 140401-802 : 2007 | DETAIL SPECIFICATION: FIXED LOW POWER FILM SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 1; 2 |
| CEI EN 61051-1 : 2010 | VARISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION |
| BS EN 61337-2:2004 | Filters using waveguide type dielectric resonators Guide for use |
| BS EN 60122-1 : 2002 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| BS EN 60749-2:2002 | Semiconductor devices. Mechanical and climatic test methods Low air pressure |
| BS EN 61810-7:2006 | Electromechanical elementary relays Test and measurement procedures |
| I.S. EN 140101:2008 | BLANK DETAIL SPECIFICATION: FIXED LOW POWER FILM RESISTORS |
| I.S. EN 62246-1:2015 | REED SWITCHES - PART 1: GENERIC SPECIFICATION |
| EN 140401-802:2007/A3:2017 | DETAIL SPECIFICATION: FIXED LOW POWER FILM SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 1; 2 |
| CEI EN 61810-7 : 2006 | ELECTROMECHANICAL ELEMENTARY RELAYS - PART 7: TEST AND MEASUREMENT PROCEDURES |
| EN 60384-1:2016 | Fixed capacitors for use in electronic equipment - Part 1: Generic specification |
| I.S. EN 60738-1:2006 | THERMISTORS - DIRECTLY HEATED POSITIVE TEMPERATURE COEFFICIENT - PART 1: GENERIC SPECIFICATION |
| I.S. EN 61020-1:2009 | ELECTROMECHANICAL SWITCHES FOR USE IN ELECTRICAL AND ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION |
| I.S. EN 140401-803:2007 | DETAIL SPECIFICATION: FIXED LOW POWER FILM SMD RESISTORS - CYLINDRICAL - STABILITY CLASSES 0,05; 0,1; 0,25; 0,5; 1; 2 |
| I.S. EN 140401-802:2007 | DETAIL SPECIFICATION: FIXED LOW POWER FILM SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 1; 2 |
| I.S. EN 61169-1:2013 | RADIO-FREQUENCY CONNECTORS - PART 1: GENERIC SPECIFICATION - GENERAL REQUIREMENTS AND MEASURING METHODS |
| EN 61169-1:2013/AC:2016-02 | RADIO-FREQUENCY CONNECTORS - PART 1: GENERIC SPECIFICATION - GENERAL REQUIREMENTS AND MEASURING METHODS (IEC 61169-1:2013) |
| EN 60938-1:1999/A1:2007 | FIXED INDUCTORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION |
| EN 60115-1:2011/A11:2015 | FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION |
| BS EN 140402-801:2015 | Detail specification: Fixed low power wirewound surface mount (SMD) resistors. Rectangular. Stability classes 0,5; 1; 2 |
| EN 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| CEI EN 61988-4 : 2008 | PLASMA DISPLAY PANELS - PART 4: CLIMATIC AND MECHANICAL TESTING METHODS |
| CEI EN 60115-2 : 2016 | FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 2: SECTIONAL SPECIFICATION: LEADED FIXED LOW POWER FILM RESISTORS |
| CEI EN 140401 : 2009 | BLANK DETAIL SPECIFICATION: FIXED LOW POWER FILM SURFACE MOUNT (SMD) RESISTORS |
| CEI EN 60115-8 : 2013 | FIXED RESISTORS FOR USE IN ELECTRONIC EQUIPMENT - PART 8: SECTIONAL SPECIFICATION - FIXED SURFACE MOUNT RESISTORS |
| BS EN 61020-1:2009 | Electromechanical switches for use in electrical and electronic equipment Generic specification |
| BS EN 62246-1:2015 | Reed switches Generic specification |
| CEI EN 60749-2 : 2004 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 2: LOW AIR PRESSURE |
| 06/30155911 DC : DRAFT SEP 2006 | BS EN 140401-801 - DETAIL SPECIFICATION - FIXED LOW POWER FILM SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 0,1; 0,25; 0,5; 1 |
| 05/30129971 DC : DRAFT FEB 2005 | EN 140402-801 - DETAIL SPECIFICATION - FIXED LOW POWER WIRE-WOUND SURFACE MOUNT (SMD) RESISTORS - RECTANGULAR - STABILITY CLASSES 0,5; 1; 2 |
| BS EN 60068-2-39:2016 | Environmental testing Tests. Tests and guidance: Combined temperature or temperature and humidity with low air pressure tests |
| BS EN 140101-806 : 2008 | DETAIL SPECIFICATION: FIXED LOW POWER FILM RESISTORS - METAL FILM RESISTORS ON HIGH GRADE CERAMIC, CONFORMAL COATED OR MOLDED, AXIAL OR PREFORMED LEADS |
| I.S. EN 60122-1:2002 AMD 1 2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| CEI EN 60068-2-41 : 2000 | ENVIRONMENTAL TESTING - PART 2: TESTS - TEST Z/BM: COMBINED DRY HEAT/LOW AIR PRESSURE TESTS |
| I.S. EN 60862-1:2015 | SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| CEI EN 60939-1 : 2011 | PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION |
| I.S. EN 61988-4:2007 | PLASMA DISPLAY PANELS - PART 4: CLIMATIC AND MECHANICAL TESTING METHODS |
| I.S. EN 140401-801:2007 | DETAIL SPECIFICATION: FIXED LOW POWER FILM SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 0,1; 0,25; 0,5; 1 |
| I.S. EN 60068-2-40:1999 | ENVIRONMENTAL TESTING - PART 2: TESTS - TEST Z/AM: COMBINED COLD/LOW AIR PRESSURE TESTS |
| EN 140401-803 : 2007 AMD 3 2017 | DETAIL SPECIFICATION: FIXED LOW POWER FILM SMD RESISTORS - CYLINDRICAL - STABILITY CLASSES 0,05; 0,1; 0,25; 0,5; 1; 2 |
| EN 140101-806 : 2008 COR 2014 | DETAIL SPECIFICATION: FIXED LOW POWER FILM RESISTORS - METAL FILM RESISTORS ON HIGH GRADE CERAMIC, CONFORMAL COATED OR MOLDED, AXIAL OR PREFORMED LEADS |
| EN 140401-801:2007/A1:2013 | DETAIL SPECIFICATION: FIXED LOW POWER FILM SMD RESISTORS - RECTANGULAR - STABILITY CLASSES 0,1; 0,25; 0,5; 1 |
| EN 60749-2:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure |
| EN 61169-8:2007 | Radio-frequency connectors - Part 8: Sectional specification - RF coaxial connectors with inner diameter of outer conductor 6,5 mm (0,256 in) with bayonet lock - Characteristic impedance 50 ohms (type BNC) |
| EN 61757-1 : 2012 | FIBRE OPTIC SENSORS - PART 1: GENERIC SPECIFICATION (IEC 61757-1:2012) |
| EN 60068-2-39:2016 | Environmental testing - Part 2-39: Tests - Tests and guidance: Combined temperature or temperature and humidity with low air pressure tests |
| EN 60122-1:2002/A1:2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017) |
| EN 60368-1:2000/A1:2004 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| EN 60115-8:2012 | Fixed resistors for use in electronic equipment - Part 8: Sectional specification - Fixed surface mount resistors |
| EN 61810-7:2006 | Electromechanical elementary relays - Part 7: Test and measurement procedures |
| EN 62575-1:2016 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification |
| EN 60115-8-1:2015 | Fixed resistors for use in electronic equipment - Part 8-1: Blank detail specification: Fixed surface mount (SMD) low power film resistors for general electronic equipment, classification level G |
| EN 140100:2008 | Sectional Specification: Fixed low power film resistors |
| EN 61338-1:2005 | Waveguide type dielectric resonators - Part 1: Generic specification |
| EN 60393-1:2009 | Potentiometers for use in electronic equipment - Part 1: Generic specification |
| EN 61337-2:2004 | Filters using waveguide type dielectric resonators - Part 2: Guidance for use |
| EN 60512-11-11:2002 | Connectors for electronic equipment - Tests and measurements - Part 11-11: Climatic tests - Test 11k: Low air pressure |
| EN 61020-1:2009 | Electromechanical switches for use in electrical and electronic equipment - Part 1: Generic specification |
| EN 61988-4 : 2007 | PLASMA DISPLAY PANELS - PART 4: CLIMATIC AND MECHANICAL TESTING METHODS |
| HD 323.2.40 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST Z AM: COMBINED COLD LOW AIR PRESSURE TESTS |
| ISO 2533:1975 | Standard Atmosphere |
| HD 323.2.41 : 200S1 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST Z/BM: COMBINED DRY HEAT/LOW AIR PRESSURE TESTS |
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