EN 62415 : 2010
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - CONSTANT CURRENT ELECTROMIGRATION TEST
Published date
06-04-2010
FOREWORD
1 Scope
2 Symbols, terms and definitions
3 Background
4 Sample size
5 Test structures
6 Test conditions
7 Failure criteria
8 Data analysis
Bibliography
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