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CEN
EN ISO 14880-4:2006

EN ISO 14880-4:2006

Current

Current

The latest, up-to-date edition.

Optics and photonics - Microlens arrays - Part 4: Test methods for geometrical properties (ISO 14880-4:2006)

Published date

06-01-2006

Publisher

Comite Europeen de Normalisation

Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Coordinate system
5 Test methods
  5.1 Pitch and surface modulation depth measurement
  5.2 Physical thickness
  5.3 Radius of curvature
  5.4 Surface preparation of microlens array for measurement
6 Procedure
  6.1 Measurement of pitch and surface modulation depth
      (lens sag)
  6.2 Measurement of physical thickness
  6.3 Measurement of radius of curvature
7 Results and uncertainties
8 Test report
Annex A (normative) Measurement with a Fizeau interferometer
        system
Annex B (informative) Uniformity of array spacing
Bibliography

ISO 14880-4:2006 specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.

Committee
CEN/TC 123
DocumentType
Standard
PublisherName
Comite Europeen de Normalisation
Status
Current

VDI 5581:2011-11 Measurement procedures for quality control in precision moulding of aspherical, freeform and microoptics

ISO 14880-2:2006 Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations
ISO 4287:1997 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters
ISO 14880-1:2016 Optics and photonics Microlens arrays Part 1: Vocabulary and general properties
ISO/TR 14999-1:2005 Optics and photonics Interferometric measurement of optical elements and optical systems Part 1: Terms, definitions and fundamental relationships
ISO 3274:1996 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments
ISO 5436-1:2000 Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 1: Material measures

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