EN ISO 21068-1:2008
Current
Current
The latest, up-to-date edition.
Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 1: General information and sample preparation (ISO 21068-1:2008)
Published date
08-01-2008
Publisher
Foreword
Introduction
1 Scope
2 Normative references
3 Definitions
4 Sampling and preparation of the test sample
4.1 General
4.2 Sample pretreatment
5 Preliminary analyses
6 Expression of results
7 Test report
Bibliography
ISO 21068-1:2008 gives definitions and specifies techniques for the preparation of samples for the chemical analysis of silicon-carbide-containing raw materials and refractory products.
| Committee |
CEN/TC 187
|
| DocumentType |
Standard
|
| PublisherName |
Comite Europeen de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| SN EN ISO 21068-1:2008 | Identical |
| DIN EN ISO 21068-1:2008-12 | Identical |
| SS-EN ISO 21068-1 : 2008 | Identical |
| NEN EN ISO 21068-1 : 2008 | Identical |
| NF EN ISO 21068-1 : 2008 | Identical |
| I.S. EN ISO 21068-1:2008 | Identical |
| BS EN ISO 21068-1:2008 | Identical |
| PN EN ISO 21068-1 : 2010 | Identical |
| UNI EN ISO 21068-1 : 2008 | Identical |
| UNE-EN ISO 21068-1:2008 | Identical |
| NBN EN ISO 21068-1 : 2008 | Identical |
| NS EN ISO 21068-1 : 1ED 2008 | Identical |
| ISO 21068-1:2008 | Identical |
| DIN EN 15979:2011-04 | Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation |
| DIN EN 15991:2016-02 | TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV) |
| BS EN 15991:2015 | Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) |
| BS EN 15979:2011 | Testing of ceramic raw and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation |
| UNI EN 15979 : 2011 | TESTING OF CERAMIC RAW AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY OES BY DC ARC EXCITATION |
| 14/30283939 DC : 0 | BS EN 15991 - TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV) |
| I.S. EN 15979:2011 | TESTING OF CERAMIC RAW AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY OES BY DC ARC EXCITATION |
| PREN 15991 : DRAFT 2014 | TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV) |
| EN 15979:2011 | Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation |
| EN 15991:2015 | Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) |
| I.S. EN 15991:2015 | TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV) |
| ISO 5725-1:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions |
| ISO 10081-1:2003 | Classification of dense shaped refractory products Part 1: Alumina-silica |
| ISO 21587-1:2007 | Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) Part 1: Apparatus, reagents, dissolution and gravimetric silica |
| ISO 21079-3:2008 | Chemical analysis of refractories containing alumina, zirconia, and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma emission spectrometry (ICP -AES) |
| ISO 21587-3:2007 | Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) Part 3: Inductively coupled plasma and atomic absorption spectrometry methods |
| ISO 5022:1979 | Shaped refractory products Sampling and acceptance testing |
| ISO 12677:2011 | Chemical analysis of refractory products by X-ray fluorescence (XRF) Fused cast-bead method |
| EN 12698-1:2007 | Chemical analysis of nitride bonded silicon carbide refractories - Part 1: Chemical methods |
| ISO 9286:1997 | Abrasive grains and crude Chemical analysis of silicon carbide |
| ISO 21079-2:2008 | Chemical analysis of refractories containing alumina, zirconia, and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 2: Wet chemical analysis |
| ISO 11648-2:2001 | Statistical aspects of sampling from bulk materials — Part 2: Sampling of particulate materials |
| ISO 21587-2:2007 | Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) Part 2: Wet chemical analysis |
| ISO 10081-4:2014 | Classification of dense shaped refractory products Part 4: Special products |
| ISO 31-0:1992 | Quantities and units Part 0: General principles |
| ISO 10081-3:2003 | Classification of dense shaped refractory products Part 3: Basic products containing from 7 % to 50 % residual carbon |
| ISO 1927:1984 | Prepared unshaped refractory materials (dense and insulating) Classification |
| ISO 10060:1993 | Dense, shaped refractory products Test methods for products containing carbon |
| ISO 21068-2:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products Part 2: Determination of loss on ignition, total carbon, free carbon and silicon carbide, total and free silica and total and free silicon |
| EN 1094-4:1995 | Insulating refractory products - Part 4: Determination of bulk density and true porosity |
| EN 12698-2:2007 | Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods |
| ISO 10081-2:2003 | Classification of dense shaped refractory products Part 2: Basic products containing less than 7 % residual carbon |
| ISO 26845:2008 | Chemical analysis of refractories General requirements for wet chemical analysis, atomic absorption spectrometry (AAS) and inductively coupled plasma atomic emission spectrometry (ICP-AES) methods |
| ISO 8656-1:1988 | Refractory products Sampling of raw materials and unshaped products Part 1: Sampling scheme |
| ISO 21079-1:2008 | Chemical analysis of refractories containing alumina, zirconia and silica — Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) — Part 1: Apparatus, reagents and dissolution |
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