I.S. EN 60444-5:1999

Committees responsible
National foreword
Methods
1 Scope
2 Introduction
3 Measurement procedures
4 Choice of admittance measurement method
5 Calibration techniques
6 Low-frequency measurements
7 Admittance analysis and estimation of the equivalent
    circuit parameters
8 Measurement errors, instrumentation and test fixtures
Annexes
A (normative) Calibration
B (informative) Low-frequency measurement
C (informative) Bibliography
Figures
1 Measurement sequence
2 Measurement methods, admittance analysis and parameter
    estimation techniques
3 One-port equivalent circuit of a single-mode quartz
    crystal unit
4 Two-port equivalent circuit of a single-mode quartz
    crystal unit
5 Admittance and impedance circle of a quartz crystal
    unit for frequencies near an isolated mode of vibration
6 General one-port equivalent circuit for multiple
    resonance
7 Two-port equivalent circuit for multiple resonances
8 Procedure for the determination of the equivalent
    circuit parameters of a quartz crystal unit
9 Calibration verification for S-parameter measurement
10 APC-3.5 Transmission fixture
11 APC-7 Transmission fixture
12 APC-7 Reflection fixture
13 APC-3.5 One-port fixture
14 APC 3.5 Two-port fixture
15 Direct transmission measurement fixture
    A.1 Simplified one-port network analyzer
    A.2 Simplified two-port, three-channel network analyzer
    A.3 Signal flowgraph representation for proposed
          12-term error model
    A.4 Typical direct transmission system
    A.5 Equivalent circuit for direct transmission method
    A.6 Thin-film calibration resistor
    A.7 Modified SMA terminating resistor
    B.1 Simplified network analyzer test system for
          low-frequency measurements
    B.2 1 : 2 Directional bridge for low-frequency
          measurements
    B.3 1 : 1 Directional bridge for low-frequency
          measurements
Annex ZA (normative) Normative references to international
publications with their corresponding European publications