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SUPERCONDUCTIVITY - PART 15: ELECTRONIC CHARACTERISTIC MEASUREMENTS - INTRINSIC SURFACE IMPEDANCE OF SUPERCONDUCTOR FILMS AT MICROWAVE FREQUENCIES (IEC 61788-15:2011 (EQV))

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Hardcopy , PDF

Language(s)

English

Published date

01-01-2011

Publisher

National Standards Authority of Ireland

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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty of the test method
8 Test Report
Annex A (informative) - Additional information
        relating to clauses 1 to 8
Annex B (informative) - Uncertainty considerations
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines measurements of the intrinsic surface impedance (Z[S]) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method.

DevelopmentNote	For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType	Standard
Pages	52
PublisherName	National Standards Authority of Ireland
Status	Current

Standards	Relationship
EN 61788-15:2011	Identical
IEC 61788-15:2011	Identical

IEC 60050-815:2015	International Electrotechnical Vocabulary (IEV) - Part 815: Superconductivity
ISO/IEC Guide 99:2007	International vocabulary of metrology Basic and general concepts and associated terms (VIM)
EN 61788-7:2006	Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
ISO/IEC Guide 98-3:2008	Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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I.S. EN 61788-15:2011

SUPERCONDUCTIVITY - PART 15: ELECTRONIC CHARACTERISTIC MEASUREMENTS - INTRINSIC SURFACE IMPEDANCE OF SUPERCONDUCTOR FILMS AT MICROWAVE FREQUENCIES (IEC 61788-15:2011 (EQV))

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