IEC 60747-12-4:1997

Withdrawn

Semiconductor devices - Part 12-4: Optoelectronic devices - Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

02-15-2005

Language(s)

English - French

Published date

05-09-1997

Publisher

International Electrotechnical Committee

Contents
Foreword
Introduction
Clause
4. Limiting values (absolute maximum rating system)
5. Electrical and optical characteristics
6. Marking
7. Ordering information
8. Test conditions and inspection requirements
9. Group D - Qualification approval tests
10. Additional information
11. Reference documents
Tables
Required information for identification
Limiting values
Electrical and optical characteristics
Group A - Lot-by-lot tests
Group B - Lot-by-lot tests
Group C - Periodic tests

DevelopmentNote	Also numbered as BS QC720104(1997) (08/2005)
DocumentType	Standard
Pages	29
PublisherName	International Electrotechnical Committee
Status	Withdrawn

Standards	Relationship
SAC GB/T 18904.4 : 2002	Identical
NEN IEC 60747-12-4 : 1998	Identical

BS QC 720106:1997	Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems
BS QC 720105:1997	Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems
IEC 61747-1:1998+AMD1:2003 CSV	Liquid crystal and solid-state display devices - Part 1: Generic specification