IEC 60748-11-1:1992
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French, Russian
Published date
04-01-1992
Publisher
FOREWORD
Clause
1 Scope and object
2 Apparatus
3 Procedure for integrated circuits
3.0 Introduction
3.1 Test conditions
3.2 Specified conditions
Figures
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