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IEC 60748-21-1:1997

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Integrated circuits - Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approva lprocedures

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

04-10-1997

INTRODUCTION
Clause
1. Characteristics and conditions of use
2. Recommended methods of mounting
3. Marking
4. Ordering information
5. Certified records of released lots
6. Additional information
7. Additional or increased severities or requirements
    to those specified in the generic and/or sectional
    specification
8. Inspection requirements (see tables 2 and 3 or 4
    and 5)
9. Supplement - Tables of method B
Tables
1. Where a range of circuits
2. Method A - Groups A and B - Lot-by-Lot
3a. Method A - Group C - Periodic tests
3b. Method A - Group D - Periodic tests
4a. Method B - Group A - Lot-by-Lot
4b. Method B - Group B - Lot-by-Lot
5a. Method B - Group C - Periodic tests
5b. Method B - Group D - Periodic tests

Committee
TC 47/SC 47A
DevelopmentNote
Also numbered as BS QC 760101(1997). (09/2003) Supersedes IEC 60186B. (07/2004) Stability Date: 2020. (09/2017)
DocumentType
Standard
Pages
29
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

Standards Relationship
SAC GB/T 13062 : 2018 Identical
NEN IEC 60748-21-1 : 1998 Identical

IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification

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