Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

04-10-1997

Publisher

International Electrotechnical Committee

CONTENTS
FOREWORD
Clause
1. Scope and object
2. General, preferred characteristics, ratings
     and severities for environmental tests
     2.1 Normative references
     2.2 Preferred ratings and characteristics
     2.3 Information to be given in a detail
          specification
3. Qualification approval procedures
     3.1 Structural similarity
     3.2 Qualification approval
     3.3 Assessment levels
     3.4 Resubmission of rejected lots (for lot-by-lot
          inspection)
     3.5 Manufacturing stages in a factory of an approved
          manufacturer in a non-IEC member country
4. Test and measurement procedures
5. Tables of method B
Tables
1. Test schedule for qualification approval for method A
2. Assessment levels and acceptance criteria for
     qualification approval for method A
3. Assessment levels and acceptance criteria for quality
     conformance inspection for method A
4. Screening
5. Test schedule for qualification approval for method B
6. Assessment levels and acceptance criteria for
     qualification approval for method B
7. Assessment levels and acceptance criteria for quality
     conformance inspection for method B

Applies to film and hybrid film integrated circuits, manufactured as catalogue or as custom-built products whose quality is assessed on the basis of Qualification Approval. Presents preferred values for rating and characteristics, selects from the generic specification the appropriate tests and measuring methods and gives general performance requirements to be used in detail specifications for film and hybrid film integrated circuits.

Committee	TC 47/SC 47A
DevelopmentNote	Also numbered as BS QC760100(1997). (09/2003) Supersedes IEC 60186B. (07/2004) Stability Date: 2020. (09/2017)
DocumentType	Standard
Pages	43
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC 60748-21:1991 IEC 60148B:1979

Standards	Relationship
SAC GB/T 11498 : 2018	Identical
NEN IEC 60748-21 : 1998	Identical

BS QC 760101:1997	Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
BS QC 760200:1997	Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
IEC 61747-1:1998+AMD1:2003 CSV	Liquid crystal and solid-state display devices - Part 1: Generic specification

IEC 60063:2015

Preferred number series for resistors and capacitors

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IEC 60748-21:1997

Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referenced By This Book

Standards Referencing This Book

Category

Subcategory