IEC 60749-23:2004
NA
NA
Status of Standard is Unknown
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Amended by
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Published date
02-23-2004
Publisher
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.
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