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IEC 61671-4:2016

Current

Current

The latest, up-to-date edition.

Standard for automatic test markup language (ATML) test configuration

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

04-08-2016

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestConfiguration schema
5 TestConfiguration instance schema
6 ATML TestConfiguration XML schema names and
  locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download web-site
        material associated with this document
Annex B (informative) - Test Configuration XML
        element mappings to MTPSI card fields
Annex C (informative) - Examples
Annex D (informative) - Bibliography
Annex E (informative) - List of IEEE Participants

IEC 61671-4:2016(E) defines an exchange format, utilizing extensible markup language (XML), for identifying all of the hardware, software, and documentation that is needed to test and diagnose a unit under test (UUT) on an ATS.

DevelopmentNote
Also numbered as IEEE 1671.4. Stability date: 2021. (04/2016)
DocumentType
Standard
Pages
45
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
NEN IEC 61671-4 : 2016 Identical
BS IEC 61671-4:2016 Identical

MIL-STD-780 Revision G:1992 WORK UNIT CODES FOR AERONAUTICAL EQUIPMENT, UNIFORM NUMBERING SYSTEM

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