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IEC 62396-1:2016 RLV

Current
Current

The latest, up-to-date edition.

Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

01-19-2016

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviations and acronyms
5 Radiation environment of the atmosphere
6 Effects of atmospheric radiation on avionics
7 Guidance for system designs
8 Determination of avionics single event effects rates
9 Considerations for SEE compliance
Annex A (informative) - Thermal neutron assessment
Annex B (informative) - Methods for calculating SEE
        rates in avionics electronics
Annex C (informative) - Review of test facility availability
Annex D (informative) - Tabular description of variation
        of atmospheric neutron flux with altitude and latitude
Annex E (informative) - Consideration of effects at higher
        altitudes
Annex F (informative) - Prediction of SEE rates for ions
Annex G (informative) - Late news as of 2014 on SEE
        cross-sections applicable to the atmospheric neutron
        environment
Annex H (informative) - Calculating SEE rates from
        non-white (non-atmospheric like) neutron
        cross-sections for small geometry electronic
        components
Bibliography

IEC 62396-1:2016 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.

IEC 62396-1:2016(E) provides guidance on atmospheric radiation effects on avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). It defines the radiation environment, the effects of that environment on electronics and provides design considerations for the accommodation of those effects within avionics systems. This International Standard helps aerospace equipment manufacturers and designers to standardise their approach to single event effects in avionics by providing guidance, leading to a standard methodology. This edition includes the following significant technical changes with respect to the previous edition:
- incorporation of references to some new papers and issues which have appeared since 2011;
- addition of solar flares and extreme space weather reference to a proposed future Part 6;
- addition of reference to a proposed new Part 7 on incorporating atmospheric radiation effects analysis into the system design process;
- addition of a reference to a proposed future Part 8 on other particles including protons, pions and muons.

Committee
TC 107
DevelopmentNote
Stability date: 2018. (01/2016)
DocumentType
Redline
Pages
215
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
SAE ARP 4754 : 2010 GUIDELINES FOR DEVELOPMENT OF CIVIL AIRCRAFT AND SYSTEMS
MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
IEC TS 62239-1:2015 Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
SAE ARP 4761 : 1996 GUIDELINES AND METHODS FOR CONDUCTION THE SAFETY ASSESSMENT PROCESS ON CIVIL AIRBORNE SYSTEMS AND EQUIPMENT
IEC 62396-4:2013 Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
FAA AC 23.1309-1 : 2011 SYSTEM SAFETY ANALYSIS AND ASSESSMENT FOR PART 23 AIRPLANES
IEC 62396-5:2014 Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
IEC 62396-3:2013 Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation
FAA AC 25.1309-1 : 0 SYSTEM DESIGN AND ANALYSIS
MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for
EIA 4899 : 2001 STANDARD FOR PREPARING AN ELECTRONIC COMPONENTS MANAGEMENT PLAN

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