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IEC PAS 62686-1:2011

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

09-18-2012

Language(s)

English

Published date

04-21-2011

Publisher

International Electrotechnical Committee

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and abbreviations
4 Abbreviations
5 Technical requirements
Annex A (normative) - STACK Specification
        S/0001 Issue 14

IEC/PAS 62686-1:2011(E) defines the minimum requirements for general purpose 'off the shelf' COTS integrated circuits and discrete semiconductors for high reliability applications. This PAS complements IEC/TS 62564-1. IEC/TS 62564-1 is to be used for high reliability applications where additional manufacturer's data is required beyond the publicly available manufacturer published datasheets. This PAS is to be used wherever possible for components that typically can be applied to operate in high reliability applications within the manufacturers publicly available datasheet limits. It is recommended that this PAS be used in conjunction with IEC/TS 62239 for avionics applications.

DocumentType
Miscellaneous Product
Pages
44
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
NEN NPR IEC/PAS 62686-1 : 2011 Identical
DD IEC PAS 62686-1 : DRAFT JULY 2011 Identical

DD IEC TS 62564-1 : DRAFT SEP 2011 PROCESS MANAGEMENT FOR AVIONICS - AEROSPACE QUALIFIED ELECTRONIC COMPONENTS (AQEC) - PART 1: INTEGRATED CIRCUITS AND DISCRETE SEMICONDUCTORS

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC TS 62239:2008 Process management for avionics - Preparation of an electronic components management plan
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
EN 100015-3 : 1993 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BASIC SPECIFICATION: REQUIREMENTS FOR CLEAN ROOM AREAS
IPC J STD 004 : B REQUIREMENTS FOR SOLDERING FLUXES
IPC J STD 033C-1:2014 HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES
IEC TS 62564-1:2016 Process management for avionics - Aerospace qualified electronic components (AQEC) - Part 1: Integrated circuits and discrete semiconductors
IPC J STD 035 : 0 ACOUSTIC MICROSCOPY FOR NON-HERMETIC ENCAPSULATED ELECTRONIC COMPONENTS

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Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
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