• IEC TS 62396-2:2008

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  09-27-2012

    Language(s):  English

    Published date:  08-19-2008

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Abbreviations used in the document
    5 Obtaining SEE data
      5.1 Types of SEE data
      5.2 Use of existing SEE data
      5.3 Deciding to perform dedicated SEE tests
    6 Availability of existing SEE data for avionics applications
      6.1 Variability of SEE data
      6.2 Types of existing SEE data that may be used
          6.2.1 Sources of data, proprietary versus published data
          6.2.2 Data based on the use of different sources
          6.2.3 Ground level versus avionics applications
      6.3 Sources of existing data
    7 Considerations for SEE testing
      7.1 General
      7.2 Selection of hardware to be tested
      7.3 Selection of test method
      7.4 Selection of facility providing energetic particles
          7.4.1 Radiation sources
          7.4.2 Spallation neutron source
          7.4.3 Monoenergetic and quasi-monoenergetic beam sources
          7.4.4 Thermal neutron sources
    8 Converting test results to avionics SEE rates
      8.1 General
      8.2 Use of spallation neutron source
      8.3 Use of SEU cross section curve over energy
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

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    Development Note Supersedes IEC PAS 62396-2. (08/2008)
    Document Type Technical Specification
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    15/30324422 DC : 0 BS EN 62396-1 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT
    BS IEC 62396-1 : 2016 PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT
    11/30246255 DC : 0 BS EN 62396-1 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC TS 62396-1:2006 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
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