IEEE C37.34-1994

1 Overview
1.1 Scope
1.2 References
2 Definitions
3 Design tests
4 Dielectric withstand voltage tests
4.1 Power-frequency withstand voltage tests
4.2 Lightning impulse dry withstand voltage tests
4.3 Power frequency and lightning impulse open gap
      withstand voltage test
4.4 Switching-impulse voltage tests of extra-high
      voltage switches
5 Radio-influence and corona tests
5.1 Simultaneous tests
5.2 Radio-influence tests
5.3 Corona tests
6 Temperature rise test
6.1 General
6.2 Mounting
6.3 Switch connections
6.4 Method of temperature determination
6.5 Ambient temperature during test
6.6 Measurement of ambient temperature
6.7 Duration of temperature rise test
6.8 Criteria for acceptance
7 Switch performance tests
7.1 Conditions of test
7.2 Ambient temperature during test
7.3 Duration of switch performance test
7.4 Criteria for acceptance
8 Tests for peak withstand and short-time
      (symmetrical) withstand current ratings
8.1 Equipment
8.2 Mounting
8.3 Switch connections
8.4 Test durations
8.5 Measurement of current
8.6 Condition of switch after test
9 Interrupting tests
9.1 Load current interrupting tests
9.2 Excitation current interrupting tests
9.3 Capacitive current switching tests
9.4 Condition of switch after test
10 Ice tests
10.1 General
10.2 Study of ice formation
10.3 Test methods
10.4 Test conditions
10.5 Test procedure
10.6 Criteria for acceptance
11 Mechanical operations test
11.1 General
11.2 Test arrangement
11.3 Test procedure
11.4 Criteria for acceptance
Annexes
Annex A - Background information (informative)
A.1 Use of higher temperature materials
A.2 Switching impulse voltage tests of switch open gap
Annex B Bibliography (informative)