IEEE DRAFT 1546 : D3.0 2000
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
04-03-2001
01-12-2013
1. OVERVIEW
1.1 SCOPE
1.2 PURPOSE
2. REFERENCES
3. DEFINITION OF TERMS AND ACRONYMS
3.1 KEY TERMS
3.2 ACRONYMS
4. DTIF FUNCTIONAL GROUPS
4.1 UUT MODEL GROUP
4.1.1 PI_NAMES(4)
4.1.2 PO_NAMES(5)
4.1.3 MAIN_MODEL(6)
4.1.4 COMPONENT_TYPE(7)
4.1.5 USER_NODE(8)
4.1.6 INPUT_PIN_NAMES(9)
4.1.7 OUTPUT_PIN_NAMES(10)
4.1.8 NEAR_FROMS_POINTERS(11)
4.1.9 NEAR_FROMS(12)
4.1.10 NODE_SOURCE(16)
4.1.11 TRISTATE_FROMS_POINTERS(21)
4.1.12 TRISTATE_FROMS(22)
4.1.13 PSEUDOPI_NAMES(23)
4.1.14 AUXILIARY_PIN_NAMES(27)
4.1.15 NODE_NAMES(35)
4.2 STIMULUS AND RESPONSE GROUP
4.2.1 STIMULUS(2)
4.2.2 PO_RESPONSE(3)
4.2.3 TIMING_SETS(24)
4.2.4 TIMING_PER_PATTERN(25)
4.2.5 PHASE_CONNECTIONS(26)
4.2.6 PI_FORMATS(28)
4.2.7 FORMAT_ATTRIBUTES(29)
4.2.8 BURSTS(33)
4.2.9 STIMULUS_ TEXT(34)
4.3 FAULT DICTIONARY GROUP
4.3.1 F.D._POPATS(18)
4.3.2 F.D._FAULT_SIGNATURES(19)
4.3.3 F.D._PRINT_STRINGS(20)
4.3.4 F.D._CROSS_ REFERENCE(30)
4.3.5 EQUIV_FAULTS(37)
4.3.6 F.D._EQUIV_FAULTS(39)
4.4 PROBE GROUP
4.4.1 EVENT(13)
4.4.2 SETTLED_STATE_ONLY(14)
4.4.3 SETTLED_STATE_&_PULSES(15)
4.4.4 STEPS(17)
4.4.5 PROBETAG_DEFINITIONS(31)
4.4.6 PROBETAG_ASSIGNMENTS(32)
4.4.7 EVENTS_INIT(36)
4.4.8 PROBE_DETECTION(38)
5. DTIF APPLICATION EXAMPLE
5.1 APPLICATION EXAMPLE-UUT MODEL GROUP
5.2 APPLICATION EXAMPLE-STIMULUS AND RESPONSE
GROUP
5.3 APPLICATION EXAMPLE-FAULT DICTIONARY GROUP
5.4 APPLICATION EXAMPLE-PROBE GROUP
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