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ISO 17901-2:2015

Current

Current

The latest, up-to-date edition.

Optics and photonics Holography Part 2: Methods for measurement of hologram recording characteristics

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

06-29-2015

ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.

DevelopmentNote
Supersedes ISO/DIS 17901-2. (07/2015)
DocumentType
Standard
Pages
20
PublisherName
International Organization for Standardization
Status
Current

Standards Relationship
BS ISO 17901-2:2015 Identical
NEN ISO 17901-2 : 2015 Identical

BS ISO 17901-1:2015 Optics and photonics. Holography Methods of measuring diffraction efficiency and associated optical characteristics of holograms
ISO 17901-1:2015 Optics and photonics Holography Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms

ISO 15902:2004 Optics and photonics Diffractive optics Vocabulary
ISO 17901-1:2015 Optics and photonics Holography Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms

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