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ISO 18115-2:2013

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

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withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy
Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

12-21-2021

Language(s)

English

Published date

11-04-2013

ISO 18115-2:2013 defines terms for surface chemical analysis.

DevelopmentNote
Together with ISO 18115-1, supersedes ISO 18115. (07/2010) Supersedes ISO/DIS 18115-2. (11/2013)
DocumentType
Standard
Pages
45
PublisherName
International Organization for Standardization
Status
Withdrawn
SupersededBy
Supersedes

Standards Relationship
JIS K 0147-2:2017 Identical
BS ISO 18115-2:2013 Identical
NF ISO 18115-2 : 2010 Identical
NEN ISO 18115-2 : 2010 Identical

11/30199166 DC : 0 BS ISO 11952 - SURFACE CHEMICAL ANALYSIS - SCANNING PROBE MICROSCOPY - DETERMINATION OF GEOMETRIC QUANTITIES USING SPM - CALIBRATION OF MEASURING SYSTEMS
ISO 11775:2015 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
BS PD ISO/TS 80004-6 : 2013 NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION
CEN ISO/TS 80004-6:2015 NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013)
BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
ASTM E 2859 : 2011 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
S.R. CEN ISO/TS 80004-6:2015 NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013)
BS ISO 23833:2013 Microbeam analysis. Electron probe microanalysis (EPMA). Vocabulary
ISO/TS 80004-13:2017 Nanotechnologies Vocabulary Part 13: Graphene and related two-dimensional (2D) materials
ASTM E 2735 : 2014 : REDLINE Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ISO 27911:2011 Surface chemical analysis — Scanning-probe microscopy — Definition and calibration of the lateral resolution of a near-field optical microscope
16/30300288 DC : 0 BS ISO 19606 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - TEST METHOD FOR SURFACE ROUGHNESS OF FINE CERAMIC FILMS BY ATOMIC FORCE MICROSCOPY
13/30203230 DC : 0 BS ISO 13095 - SURFACE CHEMICAL ANALYSIS - ATOMIC FORCE MICROSCOPY - PROCEDURE FOR IN SITU CHARACTERIZATION OF AFM PROBE SHANK PROFILE USED FOR NANOSTRUCTURE MEASUREMENT
BS ISO 13095:2014 Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
BS ISO 20579-4:2018 Surface chemical analysis. Guidelines to sample handling, preparation and mounting Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis
ASTM E 2859 : 2011 : R2017 Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ISO 20579-4:2018 Surface chemical analysis — Guidelines to sample handling, preparation and mounting — Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis
ISO 11952:2014 Surface chemical analysis Scanning-probe microscopy Determination of geometric quantities using SPM: Calibration of measuring systems
ISO/TR 19693:2018 Surface chemical analysis Characterization of functional glass substrates for biosensing applications
PD ISO/TS 80004-13:2017 Nanotechnologies. Vocabulary Graphene and related two-dimensional (2D) materials
PD CEN ISO/TS 80004-6:2015 Nanotechnologies. Vocabulary Nano-object characterization
ISO 13095:2014 Surface Chemical Analysis Atomic force microscopy Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
ASTM E 1829 : 2014 : REDLINE Standard Guide for Handling Specimens Prior to Surface Analysis
ISO/TR 18196:2016 Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
ISO/TS 80004-6:2013 Nanotechnologies Vocabulary Part 6: Nano-object characterization
BS ISO 19606:2017 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy
BS ISO 19668:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
ISO 11039:2012 Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate
ISO 19668:2017 Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS ISO 11775:2015 Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
10/30199182 DC : 0 BS ISO 11039 - SURFACE CHEMICAL ANALYSIS - SCANNING-PROBE MICROSCOPY - MEASUREMENT OF DRIFT RATE
PD ISO/TR 18196:2016 Nanotechnologies. Measurement technique matrix for the characterization of nano-objects
ISO 28600:2011 Surface chemical analysis Data transfer format for scanning-probe microscopy
ISO 20411:2018 Surface chemical analysis — Secondary ion mass spectrometry — Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
ISO 19606:2017 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy
ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 13083:2015 Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
ASTM E 1078 : 2014 : REDLINE Standard Guide for Specimen Preparation and Mounting in Surface Analysis

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