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BS EN ISO 14644-10:2013
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Cleanrooms and associated controlled environments Part 10: Classification of surface cleanliness by chemical concentration
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13/30261587 DC : 0
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BS ISO 17862 - SURFACE CHEMICAL ANALYSIS - SECONDARY ION MASS SPECTROMETRY - LINEARITY OF INTENSITY SCALE IN SINGLE ION COUNTING TIME-OF-FLIGHT MASS ANALYSERS
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ISO 18117:2009
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Surface chemical analysis — Handling of specimens prior to analysis
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I.S. EN ISO 14644-10:2013
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CLEANROOMS AND ASSOCIATED CONTROLLED ENVIRONMENTS - PART 10: CLASSIFICATION OF SURFACE CLEANLINESS BY CHEMICAL CONCENTRATION (ISO 14644-10:2013)
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ASTM E 2695 : 2009
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Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy (Withdrawn 2018)
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ISO 17862:2013
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Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
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ISO 14701:2011
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Surface chemical analysis X-ray photoelectron spectroscopy Measurement of silicon oxide thickness
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09/30184131 DC : 0
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BS ISO 29081 - SURFACE CHEMICAL ANALYSIS - AUGER ELECTRON SPECTROSCOPY - REPORTING OF METHODS USED FOR CHARGE CONTROL AND CHARGE CORRECTION
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BS ISO 16129:2012
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Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
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18/30368966 DC : 0
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BS ISO 14701 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - MEASUREMENT OF SILICON OXIDE THICKNESS
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BS ISO 18117:2009
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Surface chemical analysis. Handling of specimens prior to analysis
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|
BS ISO 16242:2011
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Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
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10/30212265 DC : 0
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BS ISO 14701 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - MEASUREMENT OF SILICON OXIDE THICKNESS
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ISO 13424:2013
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Surface chemical analysis X-ray photoelectron spectroscopy Reporting of results of thin-film analysis
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BS ISO 14701:2011
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Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
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DIN EN ISO 14644-10:2013-06
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Cleanrooms and associated controlled environments - Part 10: Classification of surface cleanliness by chemical concentration (ISO 14644-10:2013)
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ASTM E 2735 : 2014 : REDLINE
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Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
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PD ISO/TR 14187:2011
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Surface chemical analysis. Characterization of nanostructured materials
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BS ISO 29081:2010
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Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
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BS ISO 13424:2013
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Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
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|
BS ISO 16243:2011
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Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
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07/30172470 DC : 0
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BS ISO 18117 - SURFACE CHEMICAL ANALYSIS - HANDLING OF SPECIMENS PRIOR TO ANALYSIS
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11/30230635 DC : 0
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BS ISO 16129 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - PROCEDURES FOR ASSESSING THE DAY-TO-DAY PERFORMANCE OF AN X-RAY PHOTOELECTRON SPECTROMETER
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ISO 10810:2010
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Surface chemical analysis X-ray photoelectron spectroscopy Guidelines for analysis
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|
BS ISO 17862:2013
|
Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
|
|
ISO 16242:2011
|
Surface chemical analysis — Recording and reporting data in Auger electron spectroscopy (AES)
|
|
ISO 16243:2011
|
Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
|
|
BS ISO 10810:2010
|
Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
|
|
18/30368969 DC : 0
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BS ISO 16129 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - PROCEDURES FOR ASSESSING THE DAY-TO-DAY PERFORMANCE OF AN X-RAY PHOTOELECTRON SPECTROMETER
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|
09/30191895 DC : 0
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BS ISO 10810 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - GUIDELINES FOR ANALYSIS
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UNI EN ISO 14644-10 : 2013
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CLEANROOMS AND ASSOCIATED CONTROLLED ENVIRONMENTS - PART 10: CLASSIFICATION OF SURFACE CLEANLINESS BY CHEMICAL CONCENTRATION
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|
ISO 29081:2010
|
Surface chemical analysis Auger electron spectroscopy Reporting of methods used for charge control and charge correction
|
|
EN ISO 14644-10:2013
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Cleanrooms and associated controlled environments - Part 10: Classification of surface cleanliness by chemical concentration (ISO 14644-10:2013)
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|
UNE-EN ISO 14644-10:2014
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Cleanrooms and associated controlled environments - Part 10: Classification of surface cleanliness by chemical concentration (ISO 14644-10:2013)
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|
11/30196563 DC : 0
|
BS EN ISO 14644-10 - CLEANROOMS AND ASSOCIATED CONTROLLED ENVIRONMENTS - PART 10: CLASSIFICATION OF SURFACE CHEMICAL CLEANLINESS BY CHEMICAL CONCENTRATION
|
|
ISO 16129:2012
|
Surface chemical analysis X-ray photoelectron spectroscopy Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
|
|
ISO/TR 14187:2011
|
Surface chemical analysis Characterization of nanostructured materials
|
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