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ISO/TS 24597:2011

ISO/TS 24597:2011

Current

Current

The latest, up-to-date edition.

Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, French

Published date

06-07-2011

Publisher

International Organization for Standardization

ISO/TS 24597:2011 specifies methods of evaluating the sharpness of digitized images generated by a scanning electron microscope by means of a Fourier transform method, a contrast-to-gradient method and a derivative method.

Committee
ISO/TC 202/SC 4
DevelopmentNote
Supersedes ISO/DIS 24597. (06/2011)
DocumentType
Technical Specification
Pages
87
PublisherName
International Organization for Standardization
Status
Current

Standards Relationship
XP ISO/TS 24597 : 2011 XP Identical
NEN NPR ISO/TS 24597 : 2011 Identical
SAC GB/T 33838 : 2017 Identical

ASTM D 8128 : 2017 Standard Guide for Monitoring Failure Mode Progression in Industrial Applications with Rolling Element Ball Type Bearings

ISO 16700:2016 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO 22493:2014 Microbeam analysis Scanning electron microscopy Vocabulary

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Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
Hardcopy - French
PDF - French
PDF 3 Users - French
PDF 5 Users - French
PDF 9 Users - French
Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
Hardcopy - French
PDF - French
PDF 3 Users - French
PDF 5 Users - French
PDF 9 Users - French
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