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JIS K 0131:1996

JIS K 0131:1996

Current

Current

The latest, up-to-date edition.

General rules for X-ray diffractometric analysis

Available format(s)

Hardcopy , PDF

Language(s)

Japanese, English

Published date

08-31-1996

Publisher

Japanese Standards Association

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This Japanese Industrial Standard specifies the general rules for the measurements of diffracted X-ray using a X-ray diffractometer in order to make the identification and determination, the accurate measurement of lattice constant, and the measurement of crystallinity degree, of substances.

DocumentType
Standard
Pages
0
PublisherName
Japanese Standards Association
Status
Current

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Hardcopy - Japanese
Hardcopy - English
PDF - English
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