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JIS R 1633:1998

Current

Current

The latest, up-to-date edition.

Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation

Available format(s)

Hardcopy , PDF

Language(s)

English, Japanese

Published date

01-31-1998

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This Japanese Industrial Standard specifies the sample preparation method of bulk fine ceramics and fine ceramic powders for scanning electron microscope (SEM) observation using the SEM which is capable f observing the sample not in the dry condition, the volatile sample, and the non-conductive sample, is not provided with any special function nor structure, and is capable of being using under the pressure in the sample chamber of 10*2 Pa or under.

DocumentType
Standard
Pages
6
PublisherName
Japanese Standards Association
Status
Current

Reaffirmed 2017

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