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MIL-HDBK-814 Base Document:1994

MIL-HDBK-814 Base Document:1994

Current

Current

The latest, up-to-date edition.

IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES

Amended by

MIL-HDBK-814 Notice 2 - Validation:2021

Available format(s)

PDF

Publisher

US Military Specs/Standards/Handbooks

1. SCOPE
   1.1 Background
   1.2 Overview
   1.3 Limitation
2. REFERENCED DOCUMENTS
   2.1 Government documents
3. DEFINITIONS, ACRONYMS AND SYMBOLS
   3.1 Definitions
   3.2 Acronyms and symbols
4. GENERAL HARDNESS ASSURANCE REQUIREMENTS
   4.1 Radiation environments and effects
5. DETAILED HARDNESS ASSURANCE REQUIREMENTS
   5.1 Radiation design hardening
   5.2 Hardness assurance, maintenance, and surveillance
   5.3 Radiation response measurements
   5.4 Design margins and hardness critical categories
   5.5 DMBP method
   5.6 PCC method
   5.7 Combined DMBP/PCC methods
   5.8 Hardness assurance testing
   6.0 References
APPENDIX
Statistical techniques for hardness assurance
Figures
Tables

Describes the systems that must operate in radiation environment have to be designed to be survivable (hard) to radiation stress levels specified for them.

Committee
FSC 59GP
DevelopmentNote
Supersedes MIL HDBK 279 and MIL HDBK 280. (09/2004) NOTICE 1 - Notice of Validation. (02/2015) NEW CHILD NOT 2 2021 IS NOW ADDED
DocumentType
Standard
Pages
113
ProductNote
NEW CHILD NOT 2 2021 IS NOW ADDED
PublisherName
US Military Specs/Standards/Handbooks
Status
Current
Supersedes

BS EN 16602-60-15:2014 Space product assurance. Radiation hardness assurance. EEE components
SAE AS 6294/1 : 2017 REQUIREMENTS FOR PLASTIC ENCAPSULATED MICROCIRCUITS IN SPACE APPLICATIONS
MIL-HDBK-817 Base Document:1994 SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE
MIL-HDBK-816 Base Document:1994 Guidelines for Developing Radiation Hardness Assurance Device Specifications
MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for
I.S. EN 16602-60-15:2014 SPACE PRODUCT ASSURANCE - RADIATION HARDNESS ASSURANCE - EEE COMPONENTS
EN 16602-60-15:2014 Space product assurance - Radiation hardness assurance - EEE components
MIL-PRF-38534 Revision K:2017 HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR

MIL-STD-1546 Revision B:1992 PARTS, MATERIALS, AND PROCESSES CONTROL PROGRAM FOR SPACE AND LAUNCH VEHICLES
MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
MIL-STD-1547 Revision B:1992 ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
MIL I 38535 : B (1) INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
MIL-STD-414 Base Document:1957 SAMPLING PROCEDURE AND TABLE FOR INSPECTION BY VARIABLES FOR PERCENT DEFECTIVE
MIL-STD-1562 Revision W:1991 LISTS OF STANDARD MICROCIRCUITS
MIL-HDBK-816 Base Document:1994 Guidelines for Developing Radiation Hardness Assurance Device Specifications
MIL-HDBK-780 Revision D:2004 STANDARD MICROCIRCUIT DRAWINGS
MIL S 19500 : J SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-STD-100 Revision G:1997 ENGINEERING DRAWINGS
MIL H 38534 : B (1) HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR
MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
MIL-HDBK-339 Base Document:1984 CUSTOM LARGE SCALE INTEGRATED CIRCUIT DEVELOPMENT & ACQUISITION FOR SPACE VEHICLES
MIL-STD-105 Revision E:1989 SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES

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