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MIL-PRF-38534 Revision K:2017

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR
Available format(s)

PDF

Superseded date

06-22-2020

Language(s)

English

Publisher

US Military Specs/Standards/Handbooks

1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
APPENDIX A - QUALITY MANAGEMENT PROGRAM
APPENDIX B
APPENDIX C - GENERIC PERFORMANCE VERIFICATIONS FOR
             HYBRID AND MULTICHIP MODULE TECHNOLOGIES
APPENDIX D - GENERIC PERFORMANCE VERIFICATIONS FOR
             NON-HERMETIC DEVICE TECHNOLOGIES
APPENDIX E - GENERIC DESIGN AND CONSTRUCTION CRITERIA
APPENDIX F - STATISTICAL SAMPLING
APPENDIX G - RADIATION HARDNESS ASSURANCE (RHA) REQUIREMENTS
             FOR HYBRID MICROCIRCUITS AND MULTICHIP MODULES
INDEX

Specifies the general performance requirements for hybrid microcircuits, multi-chip modules (MCM) and similar devices, and the verification requirements for ensuring that these devices meet the applicable performance requirements.

Committee
FSC 5962
DevelopmentNote
Supersedes MIL H 38534 (B) (01/2003)
DocumentType
Standard
Pages
175
PublisherName
US Military Specs/Standards/Handbooks
Status
Superseded
SupersededBy

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DSCC 11224E:2023 MICROCIRCUIT, HYBRID, LINEAR, SINGLE CHANNEL, DC-DC CONVERTER

MIL-HDBK-814 Base Document:1994 IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES
MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
MIL-HDBK-1331 Revision A:2003 PARAMETERS TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS
ISO 14644-2:2015 Cleanrooms and associated controlled environments Part 2: Monitoring to provide evidence of cleanroom performance related to air cleanliness by particle concentration
ANSI/NCSL Z540 3 : 2006(R2013) REQUIREMENTS FOR THE CALIBRATION OF MEASURING AND TEST EQUIPMENT
MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
MIL-I-46058 Revision C:1972 Insulating Compound, Electrical (for Coating Printed Circuit Assemblies)
MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
GEIA SSB 1 : 2000 GUIDELINES FOR USING PLASTIC ENCAPSULATED MICROCIRCUITS AND SEMICONDUCTORS IN MILITARY, AEROSPACE AND OTHER RUGGED APPLICATIONS
IPC J STD 035 : 0 ACOUSTIC MICROSCOPY FOR NON-HERMETIC ENCAPSULATED ELECTRONIC COMPONENTS
ISO 14644-1:2015 Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration
MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for
MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
MIL-HDBK-815 Base Document:1994 DOSE-RATE HARDNESS ASSURANCE GUIDELINES
QML 38534 : 20171103 QUALIFIED PRODUCT LIST OF PRODUCTS QUALIFIED UNDER PERFORMANCE SPECIFICATION - MIL-PRF-38534 - HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR

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