MIL-PRF-38535 Revision K:2013
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Integrated Circuits (Microcircuits) Manufacturing, General Specification for
Available format(s)
PDF
Superseded date
05-04-2021
Language(s)
English
Published date
12-20-2013
Publisher
1. SCOPE
2. APPLICABLE DOCUMENTS
3. REQUIREMENTS
4. VERIFICATION
5. PACKAGING
6. NOTES
APPENDIX A - MICROCIRCUIT SPECIFICATION REQUIREMENTS
APPENDIX B - SPACE APPLICATION
APPENDIX C - RADIATION HARDNESS ASSURANCE
APPENDIX D - STATISTICAL SAMPLING, TEST, AND INSPECTION
PROCEDURES
APPENDIX F - GENERAL PROVISIONS FOR TAPE AUTOMATED BONDED
MICROCIRCUITS
APPENDIX G - THE QUALIFIED MANUFACTURERS LISTING PROGRAM
APPENDIX H - CERTIFICATION, VALIDATION, AND QUALIFICATION
APPENDIX J - TECHNOLOGY CONFORMANCE INSPECTION AND SCREENING
INFORMATION
INDEX
Determines the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for their acquisition.
This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for their acquisition. The intent of this specification is to allow the device manufacturer the flexibility to implement best commercial practices to the maximum extent possible while still providing product that meets military performance needs. Detail requirements, specific characteristics of microcircuits, and other provisions which are sensitive to the particular use intended will be specified in the device specification. Quality assurance requirements outlined herein are for all microcircuits built on a manufacturing line which is controlled through a manufacturer\'s quality management (QM) program and has been certified and qualified by the Qualifying Activity (QA) in accordance with requirements herein. Several levels of product assurance including RHA are provided for in this specification. The certification and qualification sections found herein outline the requirements to be met by a manufacturer to be listed on a Qualified Manufacturer Listing (QML). After listing of a technology flow on a QML, the manufacturer is to continually meet or improve the established baseline of certified and qualified procedures, the QM program, the manufacturer\'s review system, the status reporting, and quality and reliability assurance requirements for all QML products. The manufacturer may present alternate methods of addressing the requirements contained in this specification. These alternate methods will be approved by the Qualifying Activity. This specification requires a manufacturer to establish a process flow baseline. If sufficient quality and reliability data is available, the manufacturer, through the QM program and the manufacturer\'s review system, may modify, substitute, or delete tests. Additional information on the QML process and its philosophy is available in 6.5 herein. Clas...
| DevelopmentNote |
Supersedes EIA JEP 111 (05/2003)
|
| DocumentType |
Standard
|
| Pages |
217
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| SAE AS 6171/3 : 2016 | TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY X-RAY FLUORESCENCE TEST METHODS |
| MIL-M-38510-763 Revision B:2005 | MICROCIRCUITS, DIGITAL, ADVANCED CMOS, COUNTERS, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-655 Revision A:2005 | MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, BUS TRANSCEIVERS WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON |
| MIL-M-38510-345 Revision C:2004 | Microcircuits, Digital, Bipolar Advanced Schottky TTL, Exclusive or Gates, Monolithic Silicon |
| MIL-M-38510-203 Revision E:2007 | MICROCIRCUITS, DIGITAL, 1024 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON |
| DD IEC TS 62396-1 : DRAFT JUL 2006 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT |
| MIL-M-38510-211 Base Document:1987 | MICROCIRCUITS, DIGITAL, 32,768 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON |
| MIL-M-38510-289 Revision A:2006 | MICROCIRCUITS, DIGITAL, CMOS 4096 BIT STATIC RANDOM ACCESS MEMORY (RAM) MONOLITHIC SILICON |
| MIL-M-38510-26 Revision B:2005 | MICROCIRCUITS, DIGITAL, TTL, LOW POWER, EXCLUSIVE-OR GATES, MONOLITHIC SILICON |
| MIL-STD-1580 Revision B:2003 | DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS |
| DSCC SMD 5962-90993 : F | MICROCIRCUIT, LINEAR, OPERATIONAL AMPLIFIER, HIGH SPEED, PROGRAMMABLE SUPPLY CURRENT, MONOLITHIC SILICON |
| DSCC SMD 5962-89855 : 0 | MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ONE TIME PROGRAMMABLE, ASYNCHRONOUS REGISTERED PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON |
| MIL-M-38510-342 Revision A:2004 | Microcircuits, Digital, Bipolar, Advanced Schottky TTL, 4-Bit Binary Full Adders with Fast Carry, Monolithic Silicon |
| IEC 62396-1:2016 | Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment |
| MIL-M-38510-55 Revision G:2005 | MICROCIRCUITS, DIGITAL, CMOS, BUFFER/CONVERTER, TRUE/COMPLIMENT BUFFER, MONOLITHIC SILICON |
| MIL-M-38510-323 Revision D:2003 | Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Quadruple Bus Buffer Gates with Three State Outputs, Monolithic Silicon |
| MIL-M-38510-27 Revision B:2008 | Microcircuit, Digital, TTL, Low Power, Multiple NOR Gates, Monolithic Silicon |
| MIL-PRF-83383 Revision F:2017 | Circuit Breakers, Remote Control, Thermal, Trip Free General Specification For |
| MIL-M-38510-374 Revision A:2004 | Microcircuits, Digital, Bipolar, Advanced Low Power Schottky TTL, and Gates, Monolithic Silicon |
| MIL-M-38510-172 Revision C:2004 | Microcircuits, Digital, CMOS, and-or-Invert, Exclusive-or, Exclusive-nor Gates, Monolithic Silicon, Positive Logic |
| MIL-M-38510-291 Revision B:2006 | MICROCIRCUITS, DIGITAL, CMOS 16,384 BIT STATIC RANDOM ACCESS MEMORY (RAM) MONOLITHIC SILICON |
| MIL-M-38510-322 Revision C:2003 | Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Hex Bus Drivers with 3 State Outputs, Monolithic Silicon |
| MIL-M-38510-750 Revision B:2003 | Microcircuits, Digital, Advanced CMOS, Nand Gates, Monolithic Silicon, Positive Logic |
| MIL-M-38510-348 Revision C:2004 | Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Bus Transceivers with Three-State Outputs, Monolithic Silicon |
| MIL-M-38510-73 Revision B:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, MULTIPLE NOR GATES, MONOLITHIC SILICON |
| MIL-M-38510-110 Revision C:2003 | Microcircuits, Linear, Quad Operational Amplifiers, Monolithic Silicon |
| MIL-M-38510-753 Revision B:2003 | Microcircuits, Digital, Advanced CMOS, Flip-Flops, Monolithic Silicon, Positive Logic |
| MIL-M-38510-176 Revision B:2004 | MICROCIRCUIT, DIGITAL, CMOS, LATCHES, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-16 Revision A:2005 | MICROCIRCUITS, DIGITAL, TTL, AND GATES, MONOLITHIC SILICON |
| MIL-PRF-83419 Revision F:2016 | ALTIMETER, SERVO CONTROLLED, AUTOMATIC PRESSURE STANDBY |
| EIA 557 : 2006 | STATISTICAL PROCESS CONTROL SYSTEMS |
| MIL-M-38510-238 Revision B:2003 | Microcircuits, Digital, MOS, 4096 Bit Static Random Access Memory (RAM), Monolithic Silicon |
| MIL-M-38510-373 Revision A:2004 | Microcircuits, Digital, Bipolar, Advanced Low Power Schottky TTL, Nor Gates, Monolithic Silicon |
| MIL-M-38510-210 Revision F:2013 | Microcircuit, Digital, 16,384 Bit Schottky, Bipolar, Programmable Read-Only Memory (PROM) Monolithic Silicon |
| MIL-M-38510-13 Revision G:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, COUNTERS, MONOLITHIC SILICON |
| MIL-M-38510-663 Revision A:2006 | MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, COUNTERS, MONOLITHIC SILICON |
| MIL-M-38510-702 Revision A:2005 | MICROCIRCUITS, LINEAR, REGULATING, PULSE WIDTH MODULATORS, MONOLITHIC SILICON |
| MIL-M-38510-61 Revision C:2004 | Microcircuits, Digital, ECL, Flip-Flops, Monolithic Silicon |
| MIL-M-38510-102 Revision C:2003 | Microcircuits, Linear, Voltage Regulator, Monolithic Silicon |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-DTL-29563 Revision B:2014 | ANTENNA SYSTEM, AIMS SHIPBOARD, ELECTRONICALLY STEERED OE-120/UPX |
| DSCC 90625D:2023 | MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUFFER THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
| DSCC 92236D:2023 | MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL D REGISTERS WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON |
| DSCC 95729F:2023 | MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, RADIATION HARDENED, 4 TO 16 LINE DECODER/DEMULTIPLEXER, MONOLITHIC SILICON |
| DSCC 93173B:2023 | MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PARALLEL FIFO,MONOLITHIC SILICON |
| DSCC 87616D:2023 | MICROCIRCUIT, LINEAR, QUAD DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON |
| DSCC 84185G:2023 | MICROCIRCUIT, LINEAR, TWO-STAGE DIFFERENTIAL VIDEO AMPLIFIER, MONOLITHIC SILICON |
| DSCC 17202B:2022 | DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 |
| DSCC 6209D:2023 | MICROCIRCUIT, HYBRID, LINEAR, 3.3 VOLT, SINGLE CHANNEL, DC-DC CONVERTER |
| DSCC 92075D:2023 | MICROCIRCUIT, DIGITAL, ECL, 68030/40 ECL/TTL CLOCK DRIVER,MONOLITHIC SILICON |
| DSCC 86018F:2023 | MICROCIRCUIT, LINEAR, AC PLASMA DISPLAY DRIVERS, MONOLITHIC SILICON |
| DSCC 91549BG:2022 | MICROCIRCUIT, MEMORY, DIGITAL, CMOSEE PROGRAMMABLE READ ONLY MEMORY 256 X 16, MONOLITHIC SILICON |
| DSCC 99560H:2022 | MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED DUAL NON-INVERTING MOSFET DRIVER, MONOLITHIC SILICON |
| DSCC 89554D:2023 | MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, DUAL 4-INPUT POSITIVE-AND GATE, MONOLITHIC SILICON |
| DSCC 95525B:2023 | MICROCIRCUIT, DIGITAL, CMOS, QUAD ELECTRICALLY ERASABLE PROGRAMMABLE POTENTIOMETER, MONOLITHIC SILICON |
| DSCC 87806F:2023 | MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, BCD-TO-7 SEGMENT LATCH/DECODER/DRIVER, MONOLITHIC SILICON |
| DSCC 89525E:2023 | MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, BUS INTERFACE FLIP-FLOP, MONOLITHIC SILICON |
| DSCC 92042H:2022 | MICROCIRCUIT, LINEAR, CMOS, MULTIPLEXER,MONOLITHIC SILICON |
| DSCC 89702D:2023 | MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL J-K FLIP-FLOP WITH SET AND RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
| DSCC 87578F:2023 | MICROCIRCUIT, LINEAR, LOW-NOISE OPERATIONAL AMPLIFIER, MONOLITHIC SILICON |
| DSCC 84056H:2023 | MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL D-TYPE FLIP-FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON |
| DSCC 99514D:2023 | MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1-MEG X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON |
| DSCC 92069B:2023 | MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X PARALLEL-TO-SERIAL FIFO, MONOLITHIC SILICON |
| DSCC 88755D:2023 | MICROCIRCUIT, DIGITAL, ADVANCED CMOS,QUAD 2-INPUT MULTIPLEXER, TTL COMPATIBLEINPUTS, MONOLITHIC SILICON |
| DSCC 86054C:2023 | MICROCIRCUIT, LINEAR, ELECTROLUMINESCENT ROW DRIVER, MONOLITHIC SILICON |
| DSCC 92057B:2023 | MICROCIRCUIT, MEMORY, DIGITAL, CMOS,1K X 18 PARALLEL FIFO, MONOLITHIC SILICON |
| DSCC 89746D:2023 | MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS,8-INPUT NAND GATE, TTL COMPATIBLE INPUTS MONOLITHIC SILICON |
| DSCC 09220C:2022 | MICROCIRCUIT, LINEAR, DIFFERENTIAL ANALOG-TO-DIGITAL CONVERTER DRIVER, LOW DISTORTION, MONOLITHIC SILICON |
| DSCC 88562H:2022 | MICROCIRCUIT, LINEAR, FAST ±150 mA, POWER BUFFER, MONOLITHIC SILICON |
| DSCC 16210A:2023 | MICROCIRCUIT, LINEAR, OCTAL DIODE ARRAY PAIRS WITH REDUNDANCY, MONOLITHIC SILICON |
| DSCC 96801E:2023 | MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, HEX SCHMITT TRIGGER INVERTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
| DSCC 14228C:2023 | MICROCIRCUIT, LINEAR, SINK/SOURCE DDR TERMINATION VOLTAGE REGULATOR,MONOLITHIC SILICON |
| DSCC 91639E:2023 | MICROCIRCUIT, LINEAR, CMOS QUAD DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON |
| DSCC 87801E:2023 | MICROCIRCUIT, LINEAR, MICROPROCESSOR COMPATIBLE, 12-BIT D/A CONVERTER, MONLITHIC SILICON |
| DSCC 01517G:2022 | MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 3.3 V, 32K X 8-BIT PROM, MONOLITHIC SILICON |
| DSCC 90765G:2023 | MICROCIRCUIT, LINEAR, LINE DRIVER, QUAD DIFFERENTIAL, MONOLITHIC SILICON |
| DSCC 77049L:2023 | MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON |
| DSCC 97621D:2023 | MICROCIRCUIT, LINEAR, HIGH SPEED DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON |
| DSCC 87629J:2022 | MICROCIRCUIT, DIGITAL, FAST CMOS,NONINVERTING OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON |
| DSCC 15236C:2022 | MICROCIRCUIT, LINEAR, 30 V, LOW NOISE, RAIL TO RAIL INPUT/OUTPUT, LOW POWER QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON |
| DSCC 94521D:2022 | MICROCIRCUIT, LINEAR, PICOAMPERE INPUT CURRENT, QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON |
| DSCC 89705D:2023 | MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, QUAD 2-INPUT MULTIPLEXER WITH THREE-STATE NONINVERTING OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
| DSCC 89802D:2023 | MICROCIRCUIT, LINEAR, PRECISION, 10-VOLT VOLTAGE REFERENCE, MONOLITHIC SILICON |
| DSCC 81023P:2023 | MICROCIRCUIT, LINEAR, BI-FET OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON |
| DSCC 17232B:2023 | MICROCIRCUIT, HYBRID, LINEAR, SINGLE CHANNEL, DC-DC CONVERTER |
| DSCC 88730D:2022 | MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, QUADRUPLE, 2-INPUT POSITIVE OR DRIVERS, MONOLITHIC SILICON |
| DSCC 01515L:2023 | MICROCIRCUIT, MEMORY, DIGITAL, CMOS,FIELD PROGRAMMABLE GATE ARRAY, 72,000 GATES, MONOLITHIC SILICON |
| DSCC 21203A:2023 | MICROCIRCUIT, LINEAR, LOW DROPOUT, VOLTAGE REGULATOR, MONOLITHIC SILICON |
| DSCC 90557E:2023 | MICROCIRCUIT, DIGITAL, CMOS, DUAL PRECISION MONOSTABLE MULTIVIBRATOR MONOLITHIC SILICON |
| DSCC 90748D:2023 | MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUFFER INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICO |
| DSCC 22211:2023 | MICROCIRCUIT, HYBRID, LINEAR, SINGLE CHANNEL, DC-DC CONVERTER |
| DSCC 97603D:2023 | MICROCIRCUIT, LINEAR, DUAL, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON |
| DSCC 01512C:2023 | MICROCIRCUIT, LINEAR, DUAL, HIGH SPEED, FET DRIVER, MONOLITHIC SILICON |
| DSCC 87524E:2023 | MICROCIRCUIT, LINEAR, LINE RECEIVER, DUAL,DIFFERENTIAL, MONOLITHIC SILICON |
| DSCC 92218E:2023 | MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL EDGE TRIGGERED D FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON |
| DSCC 89680E:2023 | MICROCIRCUIT, LINEAR, OCTAL GENERAL INTERFACE BUS TRANSCEIVER, MONOLITHIC SILICON |
| MIL-DTL-917 Revision F:2014 | ELECTRIC POWER EQUIPMENT, BASIC REQUIREMENTS FOR |
| DSCC 94534G:2023 | MICROCIRCUIT, LINEAR, LOW POWER DUAL/QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON |
| DSCC 88639G:2022 | MICROCIRCUIT, DIGITAL, DIGITAL, FAST CMOS, OCTAL TRANSPARENT LATCH WITH THREE STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON |
| DSCC 07208C:2023 | MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT, 500 MSPS, ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON |
| DSCC 86069B : 2023 | MICROCIRCUIT, DIGITAL, ADVANCED SCHOTTKY TTL, MAGNITUDE COMPARATOR, MONOLITHIC SILICON |
| DSCC 88608C:2023 | MICROCIRCUIT, DIGITAL, FAST CMOS,10-BIT NONINVERTING REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
| DSCC 92223G:2023 | MICROCIRCUIT, DIGITAL, FAST CMOS,OCTAL TRANSCEIVER/REGISTER WITHTHREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON |
| MIL STD 11991 : A | GENERAL STANDARD FOR PARTS, MATERIALS, AND PROCESSES |
| MIL-M-38510-301 Revision F:2004 | Microcircuits, Digital, Bipolar Low-Power Schottky TTL, Flip-Flops, Cascadable, Monolithic Silicon |
| MIL-M-38510-346 Revision C:2004 | Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Transparent and Octal D Type Latches, Cascadable, Monolithic Silicon |
| 15/30324422 DC : 0 | BS EN 62396-1 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT |
| DSCC SMD 5962-06232 : 0 | MICROCIRCUIT, DIGITAL, RADIATION HARDENED, SPACEWIRE PHYSICAL LAYER TRANSCEIVER, MONOLITHIC SILICON |
| MIL-M-38510-313 Revision B:2003 | Microcircuits, Digital, Bipolar Low-Power Schottky TTl, Schmitt Trigger Positive Nand Gates and Inverters, Monolithic Silicon |
| BS IEC 62396-1 : 2016 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT |
| MIL-M-38510-106 Revision B:2005 | MICROCIRCUITS, LINEAR, VOLTAGE FOLLOWER OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON |
| MIL-M-38510-321 Revision C:2003 | Microcircuits, Digital, Low-Power Schottky TTL, Buffers/Drivers, Open Collector Output, High Voltage, Monolithic Silicon |
| MIL-M-38510-657 Revision A:2006 | MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, BUFFER GATES, MONOLITHIC SILICON |
| MIL-M-38510-765 Revision A:2005 | MICROCIRCUITS, DIGITAL, ADVANCED CMOS, SHIFT REGISTERS, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-327 Revision B:2003 | Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Counters, Monolithic Silicon |
| MIL-M-38510-302 Revision D:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, BUFFERS, MONOLITHIC SILICON |
| MIL-M-38510-757 Revision C:2003 | Microcircuits, Digital, Advanced CMOS, Buffer Gates, Monolithic Silicon, Positive Logic |
| MIL-M-38510-50 Revision F:2004 | MICROCIRCUITS, DIGITAL, CMOS, NAND GATES, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-112 Revision B:2004 | Microcircuits, Linear, Voltage Comparators, Monolithic Silicon |
| MIL-M-38510-152 Revision C:2005 | MICROCIRCUITS, DIGITAL, TTL, DATA DECODERS/DEMULTIPLEXERS, MONOLITHIC SILICON |
| MIL-M-38510-71 Revision D:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, FLIP-FLOPS, CASCADABLE, MONOLITHIC SILICON |
| MIL-M-38510-156 Revision C:2005 | MICROCIRCUITS, DIGITAL, TTL, DATA ENCODERS, MONOLITHIC SILICON |
| MIL-M-38510-311 Revision C:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, MAGNITUDE COMPARATORS, MONOLITHIC SILICON |
| MIL-M-38510-207 Revision E:2007 | MICROCIRCUIT, DIGITAL, 256-BIT, SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON |
| MIL-M-38510-335 Revision C:2004 | Microcircuits, Digital, Bipolar Advanced Schottky TTL, Quadruple, 2 Input or Gates, Monolithic Silicon |
| MIL-STD-1835 Revision D:2004 | ELECTRONIC COMPONENT CASE OUTLINES |
| MIL-M-38510-508 Revision A:2006 | MICROCIRCUITS, MEMORY, DIGITAL, CMOS ONE-TIME PROGRAMMABLE ARRAY LOGIC, MONOLITHIC SILICON |
| MIL-M-38510-332 Revision C:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, OCTAL BUFFERS, MONOLITHIC SILICON |
| MIL-M-38510-15 Revision B:2005 | MICROCIRCUITS, DIGITAL, TTL, BISTABLE LATCHES, MONOLITHIC SILICON |
| MIL-M-38510-656 Revision A:2005 | MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, FLIP-FLOPS, MONOLITHIC SILICON |
| MIL-M-38510-306 Revision E:2003 | Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Shift Registers, Cascadable, Monolithic Silicon |
| MIL-M-38510-190 Revision D:2005 | MICROCIRCUITS, LINEAR, CMOS/ANALOG MULTIPLEXERS/DEMULTIPLEXERS WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-651 Revision B:2005 | MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, NOR GATES, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-22 Revision D:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, HIGH-SPEED TTL, FLIP-FLOPS, MONOLITHIC SILICON |
| MIL-M-38510-23 Revision D:2003 | Microcircuits, Digital, TTL, High Speed, Nand Gates Monolithic Silicon |
| MIL-M-38510-352 Revision A:2004 | Microcircuits, Digital, Bipolar Advanced Schottky TTL, Nand Buffers, Monolithic Silicon |
| MIL-M-38510-305 Revision C:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, OR GATES, MONOLITHIC SILICON |
| IEC 62396-1 REDLINE : 2ED 2016 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT |
| SAE AS 6294/2 : 2018 | REQUIREMENTS FOR PLASTIC ENCAPSULATED MICROCIRCUITS IN MILITARY AND AVIONICS APPLICATIONS |
| IEC TS 62396-1:2006 | Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment |
| IEC TS 62239:2008 | Process management for avionics - Preparation of an electronic components management plan |
| MIL-M-38510-128 Revision A:2004 | Microcircuits, Linear, Programmable Voltage References, Monolithic Silicon |
| MIL-M-38510-312 Revision C:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, 4-BIT BINARY FULL ADDERS WITH FAST CARRY, MONOLITHIC SILICON |
| MIL-M-38510-502 Revision A:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR FIELD PROGRAMMABLE LOGIC ARRAY (FPLA) 16 X 48 X 8, MONOLITHIC SILICON |
| MIL-M-38510-304 Revision C:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON |
| MIL-M-38510-117 Revision C:2005 | MICROCIRCUITS, LINEAR, ADJUSTABLE, POSITIVE, VOLTAGE REGULATORS, MONOLITHIC SILICON |
| MIL-M-38510-59 Revision D:2006 | MICROCIRCUITS, DIGITAL, CMOS, DECODER, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-131 Revision A:2003 | Microcircuits, Linear, Low Noise Operational Amplifiers, Monolithic Silicon |
| MIL-M-38510-53 Revision F:2004 | MICROCIRCUITS, DIGITAL, CMOS, COMPLIMENTARY PAIR PLUS INVERTER, AND-OR-SELECT EXCLUSIVE OR GATES, EXPANDABLE 8-INPUT GATE MONOLITHIC SILICON |
| MIL-M-38510-8 Revision F:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, BUFFERS/DRIVERS OPEN COLLECTOR OUTPUT, HIGH VOLTAGE, MONOLITHIC SILICON |
| MIL-M-38510-361 Revision B:2004 | Microcircuits, Digital, Bipolar, Low Power Schottky TTL, Registers, Cascadable, Monolithic Silicon |
| MIL-M-38510-58 Revision D:2004 | MICROCIRCUITS, DIGITAL, CMOS, SWITCHES, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-10 Revision D:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, DECODERS, MONOLITHIC SILICON |
| MIL-M-38510-325 Revision D:2003 | Microcircuits, Digital, Bipolar, Low-Power, Schottky TTL, Flip-Flops, Cascadable, Monolithic Silicon |
| MIL-M-38510-108 Revision A:2003 | Microcircuits, Linear, Transistor Arrays, Monolithic Silicon |
| MIL-M-38510-21 Revision F:2006 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, LOW POWER, FLIP-FLOPS, MONOLITHIC SILICON |
| SAE AS 6171/7 : 2016 | TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ELECTRICAL TEST METHODS |
| MIL-M-38510-103 Revision H:2005 | MICROCIRCUITS, LINEAR, VOLTAGE COMPARATORS, MONOLITHIC SILICON |
| MIL-M-38510-328 Revision C:2003 | Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Bus Transceivers with Three State Outputs, Monolithic Silicon |
| MIL-M-38510-51 Revision F:2004 | MICROCIRCUITS, DIGITAL, CMOS, FLIP-FLOPS AND LATCHES, MONOLITHIC SILICON |
| MIL-M-38510-76 Revision C:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR SCHOTTKY TTL, CASCADABLE, SHIFT REGISTERS, MONOLITHIC SILICON |
| MIL-M-38510-350 Revision A:2004 | Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Quad 2-Port Registers, Cascadable, Monolithic Silicon |
| MIL-HDBK-780 Revision D:2004 | STANDARD MICROCIRCUIT DRAWINGS |
| MIL-M-38510-14 Revision E:2005 | MICROCIRCUITS, DIGITAL, TTL, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON |
| MIL-M-38510-340 Revision D:2003 | Microcircuits, Digital, Bipolar Advanced Schottky TTL, and Gates, Monolithic Silicon |
| MIL-M-38510-337 Revision B:2004 | Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Decoders, Monolithic Silicon |
| MIL-M-38510-119 Revision B:2004 | Microcircuits, Linear, Low Power, Low Noise, BI-FET Operational Amplifiers, Monolithic Silicon |
| MIL-M-38510-12 Revision J:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, MONOSTABLE MULTIVIBRATORS, MONOLITHIC SILICON |
| MIL-M-38510-129 Revision B:2004 | MICROCIRCUITS, MONOLITHIC SILICON INTERFACE, DUAL PERIPHERAL DRIVERS |
| MIL-M-38510-101 Revision K:2005 | MICROCIRCUITS, LINEAR, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON |
| MIL-M-38510-339 Revision E:2011 | MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, DATA SELECTORS/MULTIPLEXERS WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON |
| MIL-M-38510-17 Revision B:2005 | MICROCIRCUITS, DIGITAL, TTL, FLIP-FLOPS, MONOLITHIC SILICON |
| MIL-M-38510-505 Revision C:2006 | MICROCIRCUITS, DIGITAL, BIPOLAR PROGRAMMABLE LOGIC, MONOLITHIC SILICON |
| MIL-M-38510-300 Revision E:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, NAND GATES, MONOLITHIC SILICON |
| MIL-M-38510-383 Revision B:2004 | MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, OCTAL BUFFER GATES WITH THREE STATE OUTPUTS, MONOLITHIC SILICON |
| MIL-M-38510-755 Revision B:2003 | Microcircuits, Digital, Advanced CMOS, Transceivers, Monolithic Silicon, Positive Logic |
| MIL-M-38510-150 Revision D:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, MAGNITUDE COMPARATORS, MONOLITHIC SILICON |
| ASTM F 1263 : 2011 : REDLINE | Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts |
| MIL-M-38510-122 Revision C:2004 | Microcircuits, Linear, High Slew Rate Operational Amplifiers, Monolithic Silicon |
| MIL-M-38510-113 Revision C:2011 | MICROCIRCUITS, LINEAR, 8 BIT, DIGITAL-TO-ANALOG CONVERTERS, MONOLITHIC SILICON |
| MIL-M-38510-319 Revision C:2003 | Microcircuits, Digital, Low-Power Schottky TTL, 4 by 4 Register File, Cascadable, Monolithic Silicon |
| MIL-M-38510-151 Revision B:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, SCHMITT-TRIGGER NAND GATES, MONOLITHIC SILICON |
| MIL-M-38510-148 Revision B:2004 | Microcircuits, Linear, Adjustable, Precision Voltage Reference, Shunt Regulator, Monolithic Silicon |
| MIL-M-38510-4 Revision D:2004 | MICROCIRCUITS, DIGITAL, TTL, MULTIPLE NOR GATES, MONOLITHIC SILICON |
| MIL-M-38510-338 Revision B:2004 | Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Arithmetic Logic Units,Monolithic Silicon |
| MIL-M-38510-125 Revision B:2005 | MICROCIRCUITS, LINEAR, SAMPLE AND HOLD CIRCUITS, MONOLITHIC SILICON |
| MIL-M-38510-380 Revision B:2004 | Microcircuits, Digital, Bipolar, Advanced Low Power Schottky TTL, Binary Counters, Cascadable, Monolithic Silicon |
| MIL-M-38510-344 Revision A:2004 | Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Decade Counters, Monolithic Silicon |
| DSCC SMD 5962-87739 : H | MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON |
| IEC PAS 62239:2001 | Electronic component management plans |
| IEC TS 62239-1:2015 | Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan |
| GEIA STD 0006 : 2008 | REQUIREMENTS FOR USING ROBOTIC HOT SOLDER DIP TO REPLACE THE FINISH ON ELECTRONIC PIECE PARTS |
| NASA MSFC STD 3012 : 2012 | ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS MANAGEMENT AND CONTROL REQUIREMENTS FOR MSFC SPACE FLIGHT HARDWARE |
| MIL-HDBK-1331 Revision A:2003 | PARAMETERS TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS |
| DSCC SMD 5962-91568 : 0 | MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ONE-TIME PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON |
| MIL-M-38510-307 Revision D:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, DECODERS, MONOLITHIC SILICON |
| MIL-M-38510-30 Revision C:2008 | Microcircuits, Digital, DTL, NAND Gates Monolithic Silicon |
| MIL-M-38510-372 Revision B:2004 | Microcircuits, Digital, Bipolar, Advanced Low Power Schottky TTL, Flip-Flops Cascadable, Monolithic Silicon |
| MIL-M-38510-70 Revision C:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, NAND GATES, MONOLITHIC SILICON |
| MIL-M-38510-375 Revision A:2004 | Microcircuits, Digital, Bipolar, Advanced Low Power-Schottky TTL, or Gates, Monolithic Silicon |
| MIL-M-38510-62 Revision B:2005 | MICROCIRCUIT, DIGITAL, ECL, AND/NAND GATES, MONOLITHIC SILICON |
| MIL-M-38510-314 Revision C:2003 | Microcircuits, Digital, Low-Power Schottky, TTL, Monostable Multivibrators, Monolithic Silicon |
| MIL-M-38510-24 Revision B:2005 | MICROCIRCUITS, DIGITAL, TTL, NAND BUFFERS, HIGH SPEED, MONOLITHIC SILICON |
| MIL-M-38510-140 Revision A:2004 | Microcircuits, Linear, Monolithic and Hybrid Silicon, Microprocessor Compatible, 12 Bit Analog-to-Digital Converters |
| MIL-M-38510-171 Revision C:2004 | Microcircuits, Digital, CMOS, or Gates, Monolithic Silicon, Positive Logic |
| MIL-M-38510-245 Revision B:2006 | Microcircuits, Digital, CMOS, 4096 Bit, Static Random Access Memory (SRAM), Bulk Silicon and Silicon on Sapphire |
| MIL-M-38510-133 Revision B:2004 | MICROCIRCUITS, LINEAR, 10-BIT DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON |
| MIL-M-38510-320 Revision D:2003 | Microcircuits, Digital, Bipolar Low-Power Schottky TTL. Counters, Cascadable, Monolithic Silicon |
| MIL-M-38510-371 Revision B:2004 | Microcircuits, Digital, Bipolar, Advanced, Low-Power Schottky TTL, Flip-Flops, Monolithic Silicon |
| MIL-M-38510-336 Revision B:2004 | Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Shift Registers, Cascadable, Monolithic Silicon |
| MIL-M-38510-82 Revision C:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, MAGNITUDE COMPARATORS, MONOLITHIC SILICON |
| MIL-M-38510-351 Revision A:2004 | Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Hex Bus Drivers with 3-State Outputs, Monolithic Silicon |
| DSCC 85151 : F | DELAY LINE, THREE DELAY LINE UNITS, 14 PIN DIP COMPATIBLE, TTL INTERFACED |
| BS PD IEC 62239 : 2001 | ELECTRONIC COMPONENT MANAGEMENT PLANS |
| MIL-DTL-83739 Revision D:2012 | SWITCHES, ANTENNA, RADIO FREQUENCY, SOLID-STATE, GENERAL SPECIFICATION FOR |
| MIL-M-38510-161 Revision A:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, COMMON OR GATES, MONOLITHIC SILICON |
| MIL-M-38510-40 Revision B:2005 | MICROCIRCUITS, DIGITAL, TTL, HIGH SPEED, AND-OR-INVERT GATES, MONOLITHIC SILICON |
| MIL-M-38510-208 Revision F:2013 | Microcircuit, Digital, 4096-Bit Schottky, Bipolar, Programmable Read-Only Memory (PROM), Monolithic Silicon |
| MIL-M-38510-139 Revision C:2004 | MICROCIRCUITS, LINEAR, INTERNALLY TRIMMED ANALOG MULTIPLIER, HYBRID AND MONOLITHIC SILICON |
| MIL-M-38510-111 Revision A:2003 | Microcircuits, Analog Switch with Driver, Monolithic and Multi-Chip Silicon |
| MIL-M-38510-310 Revision D:2002 | MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON |
| MIL-M-38510-315 Revision D:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, COUNTERS, CASCADABLE, MONOLITHIC SILICON |
| MIL-M-38510-762 Revision B:2005 | MICROCIRCUITS, DIGITAL, ADVANCED CMOS, MULTIPLEXERS, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-175 Revision C:2004 | MICROCIRCUITS, DIGITAL, CMOS, POSITIVE LOGIC, FLIP-FLOPS AND MONOSTABLE MULTIVIBRATOR, MONOLITHIC SILICON |
| MIL-M-38510-109 Revision B:2004 | Microcircuits, Linear, Precision Timers, Monolithic Silicon |
| MIL-M-38510-107 Revision D:2004 | Microcircuits, Linear, Positive, Voltage Regulators, Monolithic Silicon |
| MIL-M-38510-377 Revision A:2004 | Microcircuits, Digital, Bipolar, Low Power Schottky TTL, Decoders, Monolithic Silicon |
| MIL-PRF-28750 Revision J:2017 | RELAYS, SOLID STATE, GENERAL SPECIFICATION FOR |
| MIL-M-38510-506 Revision A:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, PROGRAMMABLE LOGIC, MONOLITHIC SILICON |
| MIL-M-38510-74 Revision C:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, AND-OR-INVERT GATES, MONOLITHIC SILICON |
| MIL-M-38510-174 Revision B:2004 | MICROCIRCUITS, DIGITAL, CMOS, INVERTER, NAND BUFFER DRIVER, STROBED HEX INVERTER/BUFFER, VOLTAGE LEVEL SHIFTER MONOLITHIC, SILICON, POSITIVE LOGIC |
| MIL-M-38510-75 Revision C:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, EXCLUSIVE OR GATES, MONOLITHIC SILICON |
| MIL-M-38510-104 Revision C:2003 | Microcircuits, Linear, Line Drivers and Receivers, Monolithic Silicon |
| MIL-M-38510-316 Revision E:2003 | Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Cascadable Latches,Monolithic Silicon |
| MIL-M-38510-115 Revision B:2004 | Microcircuits, Linear, Negative, Voltage Regulators, Monolithic Silicon |
| MIL-M-38510-7 Revision C:2005 | MICROCIRCUITS, DIGITAL, TTL, EXCLUSIVE OR GATES, MONOLITHIC SILICON |
| MIL-M-38510-752 Revision C:2003 | Microcircuits, Digital, Advanced CMOS, and Gates, or Gates, Monolithic Silicon, Positive Logic |
| MIL-M-38510-658 Revision A:2006 | MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, DECODERS, MONOLITHIC SILICON, POSITIVE LOGIC |
| 11/30246255 DC : 0 | BS EN 62396-1 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT |
| MIL-M-38510-758 Revision B:2005 | MICROCIRCUITS, DIGITAL, ADVANCED CMOS, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-170 Revision C:2004 | Microcircuits, Digital, CMOS, and Gates, Monolithic Silicon, Positive Logic |
| 17/30318744 DC : 0 | BS ISO 20188 - SPACE SYSTEMS - PRODUCT ASSURANCE REQUIREMENTS FOR COMMERCIAL SATELLITES |
| DSCC 85014 : H | DELAY LINE, ACTIVE, 10 TAPS, 14 PIN DIP, TTL INTERFACED |
| EIA 4899 : 2001 | STANDARD FOR PREPARING AN ELECTRONIC COMPONENTS MANAGEMENT PLAN |
| MIL-M-38510-25 Revision E:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, LOW POWER, COUNTERS, MONOLITHIC SILICON |
| MIL-M-38510-57 Revision F:2005 | Microcircuits, Digital, CMOS, Static Shift Register, Monolithic Silicon, Positive Logic |
| MIL-M-38510-121 Revision B:2004 | Microcircuits, Linear Monolithic and Multichip, Silicon 12 Bit Digital-to-Analog Converters |
| MIL-M-38510-123 Revision B:2004 | Microcircuits, Linear, Cmos, Negative Logic, Analog Switch, Monolithic Silicon |
| MIL-M-38510-80 Revision F:2006 | MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, AND GATES, MONOLITHIC SILICON |
| MIL-M-38510-206 Revision D:2005 | MICROCIRCUIT, DIGITAL, 4096 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM) |
| MIL-M-38510-60 Revision B:2004 | MICROCIRCUIT, DIGITAL, ECL, MULTIPLE NOR GATES, MONOLITHIC SILICON |
| MIL-M-38510-9 Revision E:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, SHIFT REGISTERS, MONOLITHIC SILICON |
| MIL-M-38510-201 Revision D:2005 | MICROCIRCUIT, DIGITAL, 512-BIT, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON |
| SAE ARP 6328 : 2016 | GUIDELINE FOR DEVELOPMENT OF COUNTERFEIT ELECTRONIC PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION SYSTEMS |
| DSCC SMD 5962-87666 : B | MICROCIRCUIT, LINEAR, DUAL RS232 TRANSCEIVERS, MONOLITHIC SILICON |
| DSCC SMD 5962-92080 : A | MICROCIRCUIT, LINEAR, BUS TRANSCEIVER, DIFFERENTIAL, RS485, MONOLITHIC SILICON |
| ISO 20188:2018 | Space systems — Product assurance requirements for commercial satellites |
| SAE AS 6171 : 2016 | TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS |
| 17/30365636 DC : 0 | BS EN 62239-1 ED.1.0 - PROCESS MANAGEMENT FOR AVIONICS - MANAGEMENT PLAN - PART 1: PREPARATION AND MAINTENANCE OF AN ELECTRONIC COMPONENTS MANAGEMENT PLAN |
| PD IEC/TS 62239-1:2015 | Process management for avionics. Management plan Preparation and maintenance of an electronic components management plan |
| SAE AS 6294/1 : 2017 | REQUIREMENTS FOR PLASTIC ENCAPSULATED MICROCIRCUITS IN SPACE APPLICATIONS |
| MIL-M-38510-72 Revision C:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, NAND BUFFERS, MONOLITHIC SILICON |
| MIL-M-38510-1 Revision F:2005 | MICROCIRCUITS, DIGITAL, TTL, NAND GATES, MONOLITHIC SILICON |
| 02/203838 DC : DRAFT MAR 2002 | |
| MIL-M-38510-324 Revision D:2003 | Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Octal Buffer Gates with Three State Outputs, Monolithic Silicon |
| MIL-M-38510-20 Revision D:2005 | MICROCIRCUITS, DIGITAL, TTL, LOW POWER, NAND GATES, MONOLITHIC SILICON |
| MIL-M-38510-2 Revision G:2005 | MICROCIRCUITS, DIGITAL, TTL, FLIP-FLOPS, MONOLITHIC SILICON |
| MIL-M-38510-3 Revision G:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, NAND BUFFERS, MONOLITHIC SILICON |
| MIL-M-38510-370 Revision A:2004 | Microcircuits, Digital, Bipolar, Advanced Low Power Schottky TTL, Nand Gates, Monolithic Silicon |
| DD IEC/TS 62239:2003 | Process management for avionics. Preparation of an electronic components management plan |
| MIL-M-38510-5 Revision D:2004 | Microcircuits, Digital, TTL, and-or-Invert Gates, Monolithic Silicon |
| MIL-M-38510-78 Revision B:2005 | MICROCIRCUITS, DIGITAL, SCHOTTKY TTL, ARITHMETIC LOGIC UNIT/FUNCTION GENERATORS, MONOLITHIC SILICON |
| MIL-M-38510-114 Revision B:2003 | Microcircuits, Linear, Bi-Fet Operational Amplifiers, Monolithic Silicon |
| MIL-M-38510-63 Revision C:2006 | MICROCIRCUITS, DIGITAL, ECL, QUAD TRANSLATOR, MONOLITHIC SILICON |
| MIL-M-38510-79 Revision D:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, DATA SELECTORS/MULTIPLEXERS WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON |
| MIL-M-38510-19 Revision A:2005 | MICROCIRCUITS, DIGITAL TTL, PARITY GENERATORS/CHECKERS, MONOLITHIC SILICON |
| MIL-M-38510-153 Revision B:2005 | MICROCIRCUITS, DIGITAL, TTL, QUADRUPLE BUS BUFFER GATES WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON |
| MIL-M-38510-209 Revision H:2014 | Microcircuit, Digital, 8192-Bit, Schottky, Bipolar, Programmable Read-Only Memory (PROM), Monolithic Silicon |
| MIL-M-38510-135 Revision G:2010 | MICROCIRCUITS, LINEAR, LOW OFFSET OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON |
| MIL-M-38510-155 Revision C:2005 | MICROCIRCUITS, DIGITAL, TTL, HIGH SPEED, AND GATES MONOLITHIC SILICON |
| MIL-M-38510-650 Revision C:2005 | MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, NAND GATES, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-204 Revision F:2009 | MICROCIRCUIT, DIGITAL, 2048-BIT, SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON |
| MIL-PRF-38534 Revision K:2017 | HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
| MIL-PRF-55310 Revision E:2006 | OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR |
| MIL-M-38510-77 Revision B:2005 | MICROCIRCUITS, DIGITAL, SCHOTTKY TTL, DECODERS, MONOLITHIC SILICON |
| MIL-M-38510-341 Revision F:2004 | Microcircuits, Digital, Bipolar, Advanced, Schottky TTL, Flip-Flops, Cascadable, Monolithic Silicon |
| MIL-M-38510-507 Revision B:2006 | MICROCIRCUITS, MEMORY, DIGITAL, CMOS ULTRAVIOLET ERASABLE PROGRAMMABLE ARRAY LOGIC, MONOLITHIC SILICON |
| MIL-M-38510-18 Revision B:2005 | MICROCIRCUITS, DIGITAL, TTL, REGISTER FILE, MONOLITHIC SILICON |
| MIL-M-38510-347 Revision A:2004 | Microcircuits, Digital, Bipolar, Advanced Schottky TTL, 8-Bit Identity Comparator, Monolithic Silicon |
| MIL-M-38510-81 Revision D:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, LINE DRIVERS, MONOLITHIC SILICON |
| MIL-M-38510-116 Revision A:2004 | Microcircuits, Linear, CMOS Analog Switch with Driver, Monolithic Silicon |
| MIL-M-38510-334 Revision C:2003 | Microcircuits, Digital, Bipolar Advanced Schottky TTL, AND-OR-INVERT Gates, Monolithic Silicon |
| MIL-M-38510-141 Revision B:2004 | Microcircuits, Linear, Darlington Transistor Array, Seven and Eight Gate, Monolithic Silicon |
| MIL-M-38510-130 Revision C:2004 | Microcircuits, Monolithic Silicon, Bipolar, Interface, Memory Core Drivers |
| MIL-M-38510-504 Revision B:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR PROGRAMMABLE LOGIC, MONOLITHIC SILICON |
| MIL-M-38510-653 Revision B:2006 | MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, FLIP-FLOPS, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-35 Revision C:2005 | MICROCIRCUITS, DIGITAL CLOCK DRIVERS, MONOLITHIC SILICON |
| DSCC 85008 : H | DELAY LINES, ACTIVE, 5 TAPS, 14-PIN DIP, TTL INTERFACED |
| MIL-M-38510-754 Revision B:2005 | MICROCIRCUITS, DIGITAL, ADVANCED CMOS, LATCHES, MONOLITHIC SILICON |
| MIL-M-38510-126 Revision C:2004 | Microcircuits, Linear, Regulating, Pulse Width Modulator, Monolithic Silicon |
| MIL-M-38510-6 Revision D:2005 | MICROCIRCUITS, DIGITAL, TTL, BINARY FULL ADDERS, MONOLITHIC SILICON |
| MIL-M-38510-163 Revision B:2005 | MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, HEX BUS DRIVERS WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON |
| MIL-M-38510-11 Revision D:2005 | MICROCIRCUITS, DIGITAL, TTL, ARITHMETIC LOGIC UNITS/FUNCTION GENERATORS, MONOLITHIC SILICON |
| MIL-M-38510-52 Revision E:2004 | Microcircuits, Digital, CMOS, NOR Gates, Monolithic Silicon, Positive Logic |
| MIL-M-38510-349 Revision B:2004 | Microcircuits, Digital, Bipolar Advanced Schottky TTL, Parity Checker, Monolithic Silicon |
| MIL-M-38510-384 Revision A:2004 | MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, AND, OR, NAND AND NOR GATES, MONOLITHIC SILICON |
| MIL-M-38510-231 Revision C:2005 | MICROCIRCUITS, DIGITAL, SCHOTTKY TTL, 1024 BIT RANDOM ACCESS MEMORY (RAM), MONOLITHIC SILICON |
| MIL-M-38510-105 Revision A:2006 | MICROCIRCUIT, LINEAR, CMOS, HIGH LEVEL ANALOG SWITCH WITH DRIVER, MONOLITHIC SILICON |
| MIL-M-38510-751 Revision B:2005 | MICROCIRCUITS, DIGITAL, ADVANCED CMOS, NOR GATES, MONOLITHIC SILICON |
| MIL-M-38510-118 Revision B:2005 | MICROCIRCUITS, LINEAR, ADJUSTABLE, NEGATIVE, VOLTAGE REGULATORS, MONOLITHIC SILICON |
| MIL-M-38510-330 Revision C:2003 | Microcircuits, Digital, Bipolar Advanced Schottky TTL, Nand Gates, Monolithic Silicon |
| MIL-M-38510-28 Revision C:2005 | MICROCIRCUITS, DIGITAL, TTL, LOW POWER SHIFT REGISTERS, MONOLITHIC SILICON |
| MIL-M-38510-555 Revision B:2006 | MICROCIRCUITS, DIGITAL, CMOS, REMOTE TERMINAL INTERFACE, MONOLITHIC SILICON |
| MIL-M-38510-756 Revision B:2005 | MICROCIRCUITS, DIGITAL, ADVANCED CMOS, FLIP-FLOPS, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-652 Revision B:2005 | MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, AND GATES, OR GATES, MONOLITHIC SILICON, POSITIVE LOGIC |
| MIL-M-38510-309 Revision E:2003 | MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, DATA SELECTOR/MULTIPLEXER WITH THREE-STATE OUTPUTS, CASCADABLE, MONOLITHIC SILICON |
| MIL-M-38510-308 Revision B:2003 | Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Arithmetic Logic Units/Function Generators, Monolithic Silicon |
| MIL-DTL-62421 Revision A:2009 | CONTROL, UNIT, ELECTRONIC, DIGITAL |
| MIL-M-38510-654 Revision A:2006 | MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, LATCHES, MONOLITHIC SILICON |
| MIL-M-38510-56 Revision G:2005 | MICROCIRCUITS, DIGITAL, CMOS, COUNTERS/DIVIDERS, MONOLITHIC SILICON |
| MIL-M-38510-333 Revision C:2003 | Microcircuits, Digital, Bipolar Advanced Schottky TTL, Nor Gates, Monolithic Silicon |
| MIL-M-38510-382 Revision B:2004 | MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, D-TYPE LATCHES, CASCADABLE, MONOLITHIC SILICON |
| IEC 62396-1:2016 RLV | Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment |
| MIL-HDBK-505 Base Document:1998 | DEFINITIONS OF ITEM LEVELS, ITEM EXCHANGEABILITY, MODELS, AND RELATED TERMS |
| MIL-HDBK-814 Base Document:1994 | IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| MIL-HDBK-1331 Revision A:2003 | PARAMETERS TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS |
| MIL-PRF-55681 Revision G:2016 | CAPACITOR, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR |
| ASTM G 21 : 2015 : REDLINE | Standard Practice for Determining Resistance of Synthetic Polymeric Materials to Fungi |
| MIL-PRF-123 Revision D:2005 | CAPACITORS, FIXED, CERAMIC DIELECTRIC, (TEMPERATURE STABLE AND GENERAL PURPOSE), HIGH RELIABILITY, GENERAL SPECIFICATION FOR |
| ISO 14644-2:2015 | Cleanrooms and associated controlled environments Part 2: Monitoring to provide evidence of cleanroom performance related to air cleanliness by particle concentration |
| ANSI/NCSL Z540 3 : 2006(R2013) | REQUIREMENTS FOR THE CALIBRATION OF MEASURING AND TEST EQUIPMENT |
| MIL-I-46058 Revision C:1972 | Insulating Compound, Electrical (for Coating Printed Circuit Assemblies) |
| ASTM F 30 : 1996 | Standard Specification for Iron-Nickel Sealing Alloys |
| MIL-M-38510 Revision J:1991 | MICROCIRCUITS, SPECIFICATION FOR |
| QML 38535 : 20171103 | QUALIFIED PRODUCT LIST OF PRODUCTS QUALIFIED UNDER PERFORMANCE SPECIFICATION - MIL-PRF-38535 - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR |
| SAE AMS I 23011:2012(S2017) | IRON-NICKEL ALLOYS FOR SEALING TO GLASSES AND CERAMIC |
| ASTM B 567 : 1998 | Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method |
| MIL-HDBK-780 Revision D:2004 | STANDARD MICROCIRCUIT DRAWINGS |
| ISO 14644-1:2015 | Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration |
| MIL-HDBK-103 Revision BA:2017 | LIST OF STANDARD MICROCIRCUIT DRAWINGS |
| MIL-HDBK-815 Base Document:1994 | DOSE-RATE HARDNESS ASSURANCE GUIDELINES |
| MIL-STD-1285 Revision D:2004 | MARKING OF ELECTRICAL AND ELECTRONIC PARTS |
| EIA 557 : 2006 | STATISTICAL PROCESS CONTROL SYSTEMS |
| MIL-STD-1835 Revision D:2004 | ELECTRONIC COMPONENT CASE OUTLINES |
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