Name: NBN EN 60749-10 : 2003
Brand: NBN

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 10: MECHANICAL SHOCK

Published date

01-12-2013

Publisher

Belgian Standards

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Specifies a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation.

DocumentType	Standard
PublisherName	Belgian Standards
Status	Current

Standards	Relationship
DIN EN 60749-10:2003-04	Identical
I.S. EN 60749-10:2002	Identical
UNE-EN 60749-10:2003	Identical
BS EN 60749-10:2002	Identical
EN 60749-10:2002	Identical
NF EN 60749-10 : 2002	Identical

View more information

Sorry this product is not available in your region.

Access your standards online with a subscription

Features

Simple online access to standards, technical information and regulations.
Critical updates of standards and customisable alerts and notifications.
Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

Get in touch with us

NBN EN 60749-10 : 2003

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 10: MECHANICAL SHOCK

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory