NEN 10747-11 : 1986 AMD 2 1997
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - PART 11: SECTIONAL SPECIFICATION FOR DISCRETE DEVICES
Published date
01-12-2013
Publisher
Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, tests and measurement procedures required for the assessment of semiconductor devices.
Sorry this product is not available in your region.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.