NEN EN IEC 60512-25-3 : 2001
Current
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The latest, up-to-date edition.
CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENTS - PART 25-3: TEST 25C - RISE TIME DEGRADATION
Published date
01-12-2013
Publisher
Applies to electrical connectors, sockets, cable assemblies or interconnection systems and describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.
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