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NEN EN IEC 61338-1-5 : 2015

Current

Current

The latest, up-to-date edition.

WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY

Published date

11-02-2015

Explains a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.

DevelopmentNote
Supersedes NEN NPR IEC/PAS 61338-1-5. (10/2015)
DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current
Supersedes

Standards Relationship
EN 61338-1-5:2015 Identical
IEC 61338-1-5:2015 Identical

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