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NEN EN ISO 12179 : 2000 C1 2008

Current

Current

The latest, up-to-date edition.

GEOMETRICAL PRODUCT SPECIFICATIONS (GPS) - SURFACE TEXTURE: PROFILE METHOD - CALIBRATION OF CONTACT (STYLUS) INSTRUMENTS

Published date

01-12-2013

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Conditions of use
5 Measurement standards
6 Contact (stylus) instrument metrological
      characteristics
7 Calibration
8 Uncertainty of measurement
9 Contact (stylus) instrument calibration certificate
Annex A (normative) Calibration of instruments measuring
                    the motifs method parameters
Annex B (normative) Calibration of simplified operator
                    instruments for the measurement of
                    surface texture
Annex C (informative) Relation to the GPS matrix model
Bibliography

Applicable to the calibration of the metrological characteristics of contact (stylus) instruments for measuring surface texture using the profile procedure as specified in ISO 3274.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

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