NEN ISO 4 : 2003
Current
Current
The latest, up-to-date edition.
MEASUREMENT OF THERMAL CONDUCTIVITY OF THIN FILMS ON SILICON SUBSTRATES
Published date
01-12-2013
Publisher
Specifies a standard procedure for the three-omega method proposed for measuring the thermal conductivity of a thin, electrically insulating film, on a substrate having a thermal conductivity significantly greater than the thermal conductivity of the film.
Sorry this product is not available in your region.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.