NEN NPR IEC/TS 62132-9 : 2014
Current
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 9: MEASUREMENT OF RADIATED IMMUNITY - SURFACE SCAN METHOD
Published date
10-20-2014
Publisher
Defines a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit (IC).
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