NEN NPR IEC/TS 62878-2-4 : 2015
Current
Current
The latest, up-to-date edition.
DEVICE EMBEDDED SUBSTRATE - PART 2-4: GUIDELINES - TEST ELEMENT GROUPS (TEG)
Published date
05-26-2015
Publisher
Explains the test element group devices useful when measuring basic properties of device embedded substrates.
Sorry this product is not available in your region.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.