NEN NPR ISO/TR 19319 : 2004
Current
Current
The latest, up-to-date edition.
SURFACE CHEMICAL ANALYSIS - AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY - DETERMINATION OF LATERAL RESOLUTION, ANALYSIS AREA, AND SAMPLE AREA VIEWED BY THE ANALYSER
Published date
01-12-2013
Publisher
Gives information for measuring the lateral resolution, the analysis area, and the sample area viewed by the analyser in Auger electron spectroscopy and X-ray photoelectron spectroscopy.
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