SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)

Published date

01-12-2013

Publisher

Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.

DevelopmentNote	Indice de classement: C96-022-32. (12/2003) Supersedes NF EN 60749. (06/2007)
DocumentType	Standard
PublisherName	Association Francaise de Normalisation
Status	Current

Standards	Relationship
DIN EN 60749-32:2011-01	Identical
UNE-EN 60749-32:2004	Identical
BS EN 60749-32 : 2003	Identical
EN 60749-32:2003/A1:2010	Identical
I.S. EN 60749-32:2003	Identical
IEC 60749-32:2002+AMD1:2010 CSV	Identical
SN EN 60749-32 : 2003	Identical

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NF EN 60749-32 : 2003 AMD 1 2011

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)

Table of Contents

Abstract

General Product Information

International Equivalents

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