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NF ISO 18115 : 2006 AMD 2 2008

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

SURFACE CHEMICAL ANALYSIS - VOCABULARY
Withdrawn date

08-20-2011

Published date

01-12-2013

Avant-propos
Introduction
1 Domaine d'application
2 Abréviations
3 Format
4 Définitions relatives aux méthodes d'analyse de surface
5 Définitions des termes relatifs à l'analyse des surfaces
Annexe A (informative) Extrait de la CEI 60050-111,
         Vocabulaire Électrotechnique International -
         Chapitre 111: Physique et chimie
Bibliographie
Index alphabétique des termes

La présente Norme internationale définit les termes relatifs à l'analyse chimique des surfaces.

DevelopmentNote
Indice de classement: X21-052. PR NF ISO 18115 February 2005. (02/2005)
DocumentType
Standard
PublisherName
Association Francaise de Normalisation
Status
Withdrawn

Standards Relationship
ISO 18115:2001 Identical

NF ISO 17974 : 2009 SURFACE CHEMICAL ANALYSIS - HIGH-RESOLUTION AUGER ELECTRON SPECTROMETERS - CALIBRATION OF ENERGY SCALES FOR ELEMENTAL AND CHEMICAL-STATE ANALYSIS
NF ISO 18116 : 2006 SURFACE CHEMICAL ANALYSIS - GUIDELINES FOR PREPARATION AND MOUNTING OF SPECIMENS FOR ANALYSIS
NF ISO 18117 : 2009 SURFACE CHEMICAL ANALYSIS - HANDLING OF SPECIMENS PRIOR TO ANALYSIS
NF ISO 23812 : 2009 SURFACE CHEMICAL ANALYSIS - SECONDARY ION MASS SPECTROMETRY - METHOD FOR DEPTH CALIBRATION FOR SILICON USING MULTIPLE DELTA-LAYER REFERENCE MATERIALS
NF ISO 15472 : 2006 SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROMETERS - CALIBRATION OF ENERGY SCALES
NF ISO 18516 : 2008 SURFACE CHEMICAL ANALYSIS - AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY - DETERMINATION OF LATERAL RESOLUTION

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