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PD CEN ISO/TS 80004-6:2015

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Nanotechnologies. Vocabulary Nano-object characterization
Available format(s)

Hardcopy , PDF

Superseded date

04-22-2021

Language(s)

English

Published date

05-31-2015

Foreword
Introduction
1 Scope
2 General terms
3 Terms related to size and shape measurement
4 Terms related to chemical analysis
5 Terms related to measurement of other properties
Annex A (informative) - Index
Bibliography

Provides terms and definitions relevant to the characterization of nano-objects.

This Technical Specification lists terms and definitions relevant to the characterization of nano-objects.

Committee
NTI/1
DevelopmentNote
Renumbers and supersedes BS PD ISO/TS 80004-6. 2015 Version incorporates corrigendum to BS PD ISO/TS 80004-6. (06/2015)
DocumentType
Standard
Pages
36
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
ISO/TS 80004-6:2013 Identical
CEN ISO/TS 80004-6:2015 Identical

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ISO 13320:2009 Particle size analysis Laser diffraction methods
ISO 14644-6:2007 Cleanrooms and associated controlled environments Part 6: Vocabulary
ISO 9276-1:1998 Representation of results of particle size analysis — Part 1: Graphical representation
ISO 13099-1:2012 Colloidal systems — Methods for zeta-potential determination — Part 1: Electroacoustic and electrokinetic phenomena
ISO 29301:2010 Microbeam analysis Analytical transmission electron microscopy Methods for calibrating image magnification by using reference materials having periodic structures
ISO 18115-1:2013 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
ISO 15202-3:2004 Workplace air Determination of metals and metalloids in airborne particulate matter by inductively coupled plasma atomic emission spectrometry Part 3: Analysis
ISO 10934-2:2007 Optics and optical instruments Vocabulary for microscopy Part 2: Advanced techniques in light microscopy
ISO 26824:2013 Particle characterization of particulate systems — Vocabulary
IEC 60050-845:1987 International Electrotechnical Vocabulary (IEV) - Part 845: Lighting
ISO/TS 27687:2008 Nanotechnologies Terminology and definitions for nano-objects Nanoparticle, nanofibre and nanoplate
ISO 13943:2017 Fire safety — Vocabulary
ISO 14966:2002 Ambient air Determination of numerical concentration of inorganic fibrous particles Scanning electron microscopy method
ISO 14695:2003 Industrial fans Method of measurement of fan vibration
ISO 3252:1999 Powder metallurgy Vocabulary
ISO 472:2013 Plastics Vocabulary
ISO 3497:2000 Metallic coatings Measurement of coating thickness X-ray spectrometric methods
ISO 14644-1:2015 Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration
ISO/TS 80004-1:2015 Nanotechnologies — Vocabulary — Part 1: Core terms
ISO 4618:2014 Paints and varnishes — Terms and definitions
ISO 17751:2007 Textiles Quantitative analysis of animal fibres by microscopy Cashmere, wool, speciality fibres and their blends
ISO 18115-2:2013 Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy
ISO 921:1997 Nuclear energy Vocabulary
ISO 24173:2009 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 22309:2011 Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
ISO 9277:2010 Determination of the specific surface area of solids by gas adsorption — BET method
ISO 15900:2009 Determination of particle size distribution Differential electrical mobility analysis for aerosol particles
ISO 16014-1:2012 Plastics Determination of average molecular mass and molecular mass distribution of polymers using size-exclusion chromatography Part 1: General principles

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