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SAE J 2052 : 2016

Current
Current

The latest, up-to-date edition.

TEST DEVICE HEAD CONTACT DURATION ANALYSIS
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

07-12-2016

FOREWORD
1. SCOPE
2. REFERENCES
3. DEFINITIONS
4. DATA ACQUISITION AND PROCESSING SYSTEM
5. PROCEDURE FOR DETERMINING HEAD CONTACT
   DURATION (t[e], t[d])
6. OTHER INFORMATION
7. NOTES

Provides methods which can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

DocumentType
Standard
Pages
7
ProductNote
This standard is now stabilized
PublisherName
SAE International
Status
Current
Supersedes

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