TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV)

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Hardcopy

Published date

01-01-2016

Publisher

Swiss Standards

This European Standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.

Committee	INB/NK 9000
DocumentType	Standard
Pages	0
PublisherName	Swiss Standards
Status	Current

Standards	Relationship
EN 15991:2015	Identical

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SN EN 15991 : 2016

TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV)

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