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SN EN 60749-36 : 2003

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE

Published date

01-12-2013

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.

DocumentType
Standard
PublisherName
Swiss Standards
Status
Current

Standards Relationship
DIN EN 60749-36:2003-12 Identical
EN 60749-36:2003 Identical
IEC 60749-36:2003 Identical
I.S. EN 60749-36:2003 Identical
UNE-EN 60749-36:2004 Identical
BS EN 60749-36:2003 Identical

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