SS-EN IEC 60749-10, UTG 2:2022
Current
Current
The latest, up-to-date edition.
Semiconductor components - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Published date
10-19-2022
Publisher
| DocumentType |
Test Method
|
| PublisherName |
Standardiserings-Kommissionen I Sverige
|
| Status |
Current
|
Sorry this product is not available in your region.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.