ELECTRICALLY ISOLATED SEMICONDUCTOR DEVICES

Available format(s)

Hardcopy

Language(s)

English

Published date

03-19-2018

Publisher

Underwriters Laboratories

FOREWORD
GENERAL
1. Scope
2. Glossary
3. Units of Measurement
CONSTRUCTION
4. General
5. Insulating Materials
6. Live Parts
7. Wiring Terminals
8. Spacings
PERFORMANCE
9. General
10. Dielectric Voltage - Withstand Test
11. Limited Thermal Aging Test
MANUFACTURING AND PRODUCTION - LINE TEST
12. Dielectric Voltage - Withstand Test
RATING
13. General
MARKING
14. General

The Sixth Edition of the Standard for Safety for Electrically Isolated Semiconductor Devices, UL 1557, has been issued to reflect the latest ANSI approval date and to incorporate the following proposal: • Adding dc production line dielectric testing

DocumentType	Standard
Pages	0
PublisherName	Underwriters Laboratories
Status	Current
Supersedes	UL 1557 : 5

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UL 1557 : 6

ELECTRICALLY ISOLATED SEMICONDUCTOR DEVICES

Table of Contents

Abstract

Scope

General Product Information

Category

Subcategory