UNE-EN 60749-38:2008
Current
Current
The latest, up-to-date edition.
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
09-01-2008
Publisher
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
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