UNE-EN 60749-44:2016
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
12-01-2016
Publisher
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-3541-6
|
| Pages |
28
|
| ProductNote |
THIS STANDARD ALSO REFERS TO:JESD89-2A. THIS STANDARD IS IDENTICAL TO :IEC 60749-44
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
Important note : All end users must be registered with an Account prior to user licenses being assigned.Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.